June 20, 2010
Author(s)
Kristine A. Bertness, John B. Schlager, Norman A. Sanford, Atif A. Imtiaz, Thomas M. Wallis, Joel C. Weber, Pavel Kabos, Lorelle M. Mansfield
We demonstrate that near field scanning microwave microscopy (NSMM) can be used to detect photoresponse in photovoltaic materials with potential for submicrometer resolution. In this approach, a radio-frequency scanning tunneling microscopy (RF-STM) tip is