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NIST Authors in Bold

Displaying 501 - 525 of 2125

Imaging Optics and CCD Camera Characterization for Metrology

February 19, 2017
Author(s)
S Fox, Edward A. Kornegay, Richard M. Silver
Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performance to

Adaptive Multi-scale Prognostics and Health Management for Smart Manufacturing Systems

February 10, 2017
Author(s)
Benjamin Y. Choo, Brian Weiss, Jeremy Marvel, Stephen C. Adams, Peter A. Beling
Adaptive Multi-scale Prognostics and Health Management (AM-PHM) is a methodology designed to enable PHM in smart manufacturing systems. As a rule, PHM information is not yet fully utilized in higher-level decision-making in manufacturing systems. AM-PHM

Enabling photoemission electron microscopy in liquids via graphene-capped microchannel arrays

February 8, 2017
Author(s)
Hongxuan Guo, Evgheni Strelcov, Alexander Yulaev, Jian Wang, Narayana Appathurai, Stephen Urquhart, John Vinson, Subin Sahu, Michael P. Zwolak, Andrei Kolmakov
Photoelectron emission microscopy (PEEM) is a powerful tool to spectroscopically access dynamic surface processes at the nanoscale but is traditionally limited to ultra-high or moderate vacuum conditions. Here, we develop a novel graphene-capped

Industrial Wireless Systems: Radio Propagation Measurements

January 30, 2017
Author(s)
Richard Candell, Catherine A. Remley, Jeanne T. Quimby, David R. Novotny, Alexandra Curtin, Peter B. Papazian, Galen H. Koepke, Joseph Diener, Mohamed T. Hany
Radio frequency (RF) propagation measurements were conducted at three facilities representing a cross-section of different classes of industrial environments. Selected sites included a multi-acre transmission assembly factory typical of the automotive

Homogenization Kinetics of a Nickel-based Superalloy Produced by Powder Bed Fusion Laser Sintering

January 26, 2017
Author(s)
Fan Zhang, Lyle E. Levine, Andrew J. Allen, Eric Lass, Sudha Cheruvathur, Mark R. Stoudt, Maureen E. Williams, Yaakov S. Idell, Carelyn E. Campbell
Additively manufactured (AM) metal components often exhibit fine dendritic microstructures and elemental segregation due to the initial rapid solidification and subsequent melting and cooling during the build process, which without homogenization would

Laser-assisted atom probe tomography of Ti/TiN films deposited on Si

December 21, 2016
Author(s)
Norman A. Sanford, Paul T. Blanchard, Ryan M. White, Michael R. Vissers, Albert Davydov, D R. Diercks, David P. Pappas
Laser-assisted atom probe tomography (L-APT) was used to examine superconducting TiN/Ti/TiN trilayer films with nominal respective thicknesses of 5/5/5 (nm). The trilayers were deposited on Si substrates by reactive sputtering. Electron energy loss

Trapping States of Mixed-Isomer Organic Semiconductors within Organic Field-Effect Transistors

December 14, 2016
Author(s)
Peter Diemer, Jacori Hayes, Evan Welchman, Rawad Hallani, Sujitra Pookpanratana, Christina Hacker, Curt A. Richter, Timo Thonhauser, Oana Jurchescu
Organic field effect transistor (OFET) performance is dictated by the composition and geometry of the device, as well as the quality of the organic semiconductor (OSC) film, which strongly depends on the purity and structural defects. When present, these

STANDARDS SUPPORTING SIMULATIONS OF SMART MANUFACTURING SYSTEMS

December 12, 2016
Author(s)
Conrad Bock, Guodong Shao, Kevin W. Lyons, Ronay Ak, KC Morris, Bjoern J. Johansson
Manufacturing standards provide the means for industries to effectively and consistently deploy methodologies and technologies to assess process performance. These assessments set the stage for controlling the manufacturing systems and processes and

STANDARDS BASED GENERATION OF A VIRTUAL FACTORY MODEL

December 11, 2016
Author(s)
Sanjay Jain, David Lechevalier
Development of manufacturing simulation models usually requires experts with knowledge of multiple areas including manufacturing, modeling, and simulation software. The expertise requirements increase for virtual factory models that include representation

Editorial - Special Issue: Smart Manufacturing PHM

December 7, 2016
Author(s)
Brian A. Weiss, Philip Freeman, Jay Lee, Radu Pavel
This Special Issue on Smart Manufacturing PHM contains six outstanding technical papers and one communication that collectively present a diverse range of research and practical application topics within the field of Smart Manufacturing PHM.

Thermographic Measurements of the Commercial Laser Powder Bed Fusion Process at NIST

December 5, 2016
Author(s)
Brandon M. Lane, Shawn P. Moylan, Eric P. Whitenton, Li Ma
Measurement of the high-temperature melt pool region in the laser powder bed fusion (L-PBF) process is a primary focus of researchers to further understand the dynamic physics of the heating, melting, adhesion, and cooling which define this commercially

An Open Web-Based Repository for Capturing Manufacturing Process Information

December 1, 2016
Author(s)
William Z. Bernstein, Mahesh Mani, Katherine C. Morris, Kevin W. Lyons, Bjoern J. Johansson
With recent progress in developing more effective models for representing manufacturing processes, this paper presents an approach towards an open web-based repository for storing manufacturing process information. The repository is envisioned to include

Membrane-Based Environmental Cells for SEM in Liquids

December 1, 2016
Author(s)
Andrei A. Kolmakov
Environmental electron microscopy and Scanning Electron Microscopy (SEM) in liquids are among the most active research areas in modern electron microscopy and spectroscopy. Research interest in these techniques is broad as they are enabling the nanoscale

Let’s Talk, Robots

November 21, 2016
Author(s)
Craig I. Schlenoff
This is a short article for Scientific Computing Magazine, at the request of the editor, that describes the IEEE 1872 IEEE Standard Ontologies for Robotics and Automation standard.

Survey and New Directions for Physics-Based Attack Detection in Control Systems

November 21, 2016
Author(s)
David Urbina, Jairo Giraldo, Alvaro Cardenas, Junia Valente, Mustafa Faisal, Niles O. Tippenhauer, Justin Ruths, Rick Candell, Heinrik Sandberg
Monitoring the "physics" of control systems to detect attacks is a growing area of research. In its basic form a security monitor creates time-series models of sensor readings for an industrial control system and identifies anomalies in these measurements
Displaying 501 - 525 of 2125