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Displaying 501 - 525 of 1560

Shielding And Attenuation Properties of Large Buildings and Structures

September 4, 2006
Author(s)
Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Kate Remley, S. A. Schima, Dylan Williams
For various applications, there is a growing need to understand the shielding and/or attenuation properties of large buildings and structures. In this paper, we present experimental data for the coupling of electromagnetic fields into various types of

Proposal for Development of a National Microwave Brightness-Temperature Standard

September 1, 2006
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker
We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The proposal is a combined standard that would comprise both a standard radiometer, traceable to

Wideband Large-Signal RF Measurements Applied to Behavioral Model Extraction

September 1, 2006
Author(s)
Kate Remley, M. Myslinski, Dominique Schreurs, Bart Nauwelaers
This work presents for the first time wideband Large Signal Network Analyzer (LSNA) measurements used to extract a large-signal behavioral model of an RF amplifier. The methodology together with some important issues concerning the data processing is

Proposed Development of a National Standard for Microwave Brightness Temperature

August 4, 2006
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker
We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The proposal is a combined standard that would comprise both a standard radiometer, traceable to

Editorial for IEEE Transactions on Microwave Theory and Techniques Mini-Special Issue on Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems

August 1, 2006
Author(s)
Kate Remley, Nuno de Carvalho, David Root
As Guest Editors, we are honored and excited to introduce this Mini-Special Issue of the Transactions devoted to Measurements for Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems. Large-signal measurements

WirelessMAN: Inside the IEEE 802.16 Standard for Wireless Metropolitan Area Networks

July 27, 2006
Author(s)
Roger Marks, Carl Eklund, Subbu Ponnuswamy, Kenneth L. Stanwood, Nico J. van Waes
This book serves as a companion to IEEE Std 802.16, which defines the IEEE 802.16 WirelessMAN Standard for Wireless Metropolitan Area Networks. It provides an introduction and overview of the technology while explaining the rationale behind the choices

On-Wafer Noise-Parameter Measurements at NIST

July 14, 2006
Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor

Supplementary Comparison of RF Power Measurements with 2.4 mm Connectors, CCEM.RF-S1.CL

July 14, 2006
Author(s)
Thomas P. Crowley, J Miall, J dereede, J. Furrer, A Michaud, E. Dressler, T Zhang, K. Shimaoka, J H. Kim
We present the results of a supplementary comparison in RF power measurements with 2.4 mm connectors. This is the highest frequency RF power comparison with coaxial connectors. All participant measurements agree with the reference values within their

Terahertz radiometer design for traceable noise-temperature measurements

July 14, 2006
Author(s)
Eyal Gerecht, Dazhen Gu, James P. Randa, Dave K. Walker, Robert L. Billinger
We report on design of a radiometer for traceable noise-temperature measurements at terahertz frequencies, including noise measurements on cryogenic IF components, development and test of quasi-optical adapter technology, development of black body

Experimental separability of channeling giant magnetoresistance in Co/Cu/Co

July 13, 2006
Author(s)
William E. Bailey, Stephen E. Russek, X.-G. Zhang, W. H. Butler
The magnitude of the electronic channeling contribution is a significant open issue in the understanding of giant magnetoresistance (GMR). We show that for the technologically important system Co/Cu/Co, channeling GMR can be isolatedand quantified

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

July 12, 2006
Author(s)
Donna C. Hurley, M Kopycinski-Muller, Eric Langlois, Anthony B. Kos, N. Barbosa
We have used contact-resonance-frequency atomic force microscopy techniques to nondestructively image variations in adhesion as a buried interface. Images were acquired on a sample containing a 20nm gold (Au) blanket film on silicon (Si) with a 1 nm

A Comprehensive Evaluation of an Outdoor Vehicular Test Range

July 1, 2006
Author(s)
Robert T. Johnk, David R. Novotny, Chriss A. Grosvenor, Nino Canales, Janalee A. Graham, Doug Martin, Scott Yencer, Donald Hibbard, Louis L. Nagy, Tyrone L. Roach
This paper describes a thorough evaluation of an outdoor automotive antenna test range. Electric-field uniformity results are generated from accurate, full-wave electromagnetic simulations of the test range. Measured electric-field results using an

Reverse Noise Measurement and Use in Device Characterization

June 10, 2006
Author(s)
James P. Randa, Tom McKay, Susan L. Sweeney, Dave K. Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check

Voltage Versus Magnetic Field Measurements on Nb 3 Sn Wires

May 31, 2006
Author(s)
Loren F. Goodrich
We measured voltage versus magnetic field (V-H}/I}) on commercial Nb 3Sn wires. Typically, voltage-current (V-I) at constant field is measured to determine the critical current (I c). Recently, V-H at constant or ramping current is being measured to assess

Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

May 22, 2006
Author(s)
Sangita S. Kalarickal, Pavol Krivosik, Mingzhong Wu, C E. Patton, Michael Schneider, Pavel Kabos, Thomas J. Silva, John P. Nibarger
Strip line (SL), vector network analyzer (VNA), and pulsed inductive microwave magnetometer (PIMM) techniques were used to measure the ferromagnetic resonance (FMR) linewidth for a series of Permalloy films with thicknesses of 50 and 100 nm. The SL-FMR

Structure, ferromagnetic resonance and permeability of nanogranular fe-Co-B-Ni films

May 16, 2006
Author(s)
Pasquale Massimo, Celegato Federica, Coisson Marco, Magni Alessandro, Perero Sergio, Pavel Kabos, Teppati Valeria, Han Suk Hee, Kim Jongryoul, Lim Sang Ho
The static and microwave magnetic properties of soft nanogranular (Fe0.7)Co0.3)71B22Ni films with a 2T saturation magnetization are presented as a function of thickness, ranging from 135 to 235 nm. Microwave permeability values from 10 to 50 are measured
Displaying 501 - 525 of 1560