An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performance to
This guest editorial looks at the resurgence of artificial intelligence, machine learning, and other related technologies. It explores its impact on government policy, national productivity growth, academic research, the role of humans, and the impact on
Manufacturing systems with perishable products are widely observed in practice (e.g., food industry, biochemical productions, battery and semiconductor manufacturing, etc.). In such systems, the quality of the product is highly affected by its exposure
Benjamin Y. Choo, Brian Weiss, Jeremy Marvel, Stephen C. Adams, Peter A. Beling
Adaptive Multi-scale Prognostics and Health Management (AM-PHM) is a methodology designed to enable PHM in smart manufacturing systems. As a rule, PHM information is not yet fully utilized in higher-level decision-making in manufacturing systems. AM-PHM
Hongxuan Guo, Evgheni Strelcov, Alexander Yulaev, Jian Wang, Narayana Appathurai, Stephen Urquhart, John Vinson, Subin Sahu, Michael P. Zwolak, Andrei Kolmakov
Photoelectron emission microscopy (PEEM) is a powerful tool to spectroscopically access dynamic surface processes at the nanoscale but is traditionally limited to ultra-high or moderate vacuum conditions. Here, we develop a novel graphene-capped
This computer code contains the Tennessee Eastman (TESIM) chemical process model to be simulated using hardware-based simulation approaches. The code is optimized for wireless system integration as a part of the NIST Industrial Wireless project. This code
Richard Candell, Catherine A. Remley, Jeanne T. Quimby, David R. Novotny, Alexandra Curtin, Peter B. Papazian, Galen H. Koepke, Joseph Diener, Mohamed T. Hany
Radio frequency (RF) propagation measurements were conducted at three facilities representing a cross-section of different classes of industrial environments. Selected sites included a multi-acre transmission assembly factory typical of the automotive
Fan Zhang, Lyle E. Levine, Andrew J. Allen, Eric Lass, Sudha Cheruvathur, Mark R. Stoudt, Maureen E. Williams, Yaakov S. Idell, Carelyn E. Campbell
Additively manufactured (AM) metal components often exhibit fine dendritic microstructures and elemental segregation due to the initial rapid solidification and subsequent melting and cooling during the build process, which without homogenization would
Paul J. Schroeder, Robert J. Wright, Sean Coburn, Bennett Sodergren, Kevin C. Cossel, Stefan Droste, Gar W. Truong, Esther Baumann, Fabrizio R. Giorgetta, Ian R. Coddington, Nathan R. Newbury, Gregory B. Rieker
Norman A. Sanford, Paul T. Blanchard, Ryan M. White, Michael R. Vissers, Albert Davydov, D R. Diercks, David P. Pappas
Laser-assisted atom probe tomography (L-APT) was used to examine superconducting TiN/Ti/TiN trilayer films with nominal respective thicknesses of 5/5/5 (nm). The trilayers were deposited on Si substrates by reactive sputtering. Electron energy loss
The report does not have an abstract, but the following is the Introduction: The pervasive application of wireless communications is well known. One such application is to an indoor factory environment. This environment creates challenges for reliable
Peter Diemer, Jacori Hayes, Evan Welchman, Rawad Hallani, Sujitra Pookpanratana, Christina Hacker, Curt A. Richter, Timo Thonhauser, Oana Jurchescu
Organic field effect transistor (OFET) performance is dictated by the composition and geometry of the device, as well as the quality of the organic semiconductor (OSC) film, which strongly depends on the purity and structural defects. When present, these
Conrad Bock, Guodong Shao, Kevin W. Lyons, Ronay Ak, KC Morris, Bjoern J. Johansson
Manufacturing standards provide the means for industries to effectively and consistently deploy methodologies and technologies to assess process performance. These assessments set the stage for controlling the manufacturing systems and processes and
Development of manufacturing simulation models usually requires experts with knowledge of multiple areas including manufacturing, modeling, and simulation software. The expertise requirements increase for virtual factory models that include representation
Brian A. Weiss, Philip Freeman, Jay Lee, Radu Pavel
This Special Issue on Smart Manufacturing PHM contains six outstanding technical papers and one communication that collectively present a diverse range of research and practical application topics within the field of Smart Manufacturing PHM.
Brian A. Weiss, Moneer Helu, Gregory W. Vogl, Guixiu Qiao
Manufacturing operations suffer from degradation as equipment and processes are continually used to generate products. The development and integration of monitoring, diagnostic, and prognostic (collectively known as PHM) technologies can enhance
Yung-Tsun T. Lee, Max Ferguson, Kincho H. Law, Jinkyoo Park, Raunak Bhinge
The use of data-driven predictive models is becoming increasingly popular in engineering and manufacturing sectors. This paper discusses the deployment of Gaussian Process Regression (GPR) predictive models for smart manufacturing. A scoring engine is
Brandon M. Lane, Shawn P. Moylan, Eric P. Whitenton, Li Ma
Measurement of the high-temperature melt pool region in the laser powder bed fusion (L-PBF) process is a primary focus of researchers to further understand the dynamic physics of the heating, melting, adhesion, and cooling which define this commercially
William Z. Bernstein, Mahesh Mani, Katherine C. Morris, Kevin W. Lyons, Bjoern J. Johansson
With recent progress in developing more effective models for representing manufacturing processes, this paper presents an approach towards an open web-based repository for storing manufacturing process information. The repository is envisioned to include
Environmental electron microscopy and Scanning Electron Microscopy (SEM) in liquids are among the most active research areas in modern electron microscopy and spectroscopy. Research interest in these techniques is broad as they are enabling the nanoscale
As Additive Manufacturing (AM) matures as a technology, predictive modeling methods have become increasingly sought after as a means for process planning, monitoring and control. For many, predictive modeling offers the potential to complement, and in some
Magnesium oxide (MgO) is a good candidate for an interface layer in multifunctional metal-oxide nanoscale thin-film heterostructures due to its high breakdown field and compatibility with complex oxides through O-bonding. In this research molecular beam
The NIST Digital Manufacturing Certificate (DMC) Toolkit is a toolkit designed specifically to provide certification -- digital signature using software and hardware certificates, and verification -- of manufacturing related product data. In its first
This is a short article for Scientific Computing Magazine, at the request of the editor, that describes the IEEE 1872 IEEE Standard Ontologies for Robotics and Automation standard.
David Urbina, Jairo Giraldo, Alvaro Cardenas, Junia Valente, Mustafa Faisal, Niles O. Tippenhauer, Justin Ruths, Rick Candell, Heinrik Sandberg
Monitoring the "physics" of control systems to detect attacks is a growing area of research. In its basic form a security monitor creates time-series models of sensor readings for an industrial control system and identifies anomalies in these measurements