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Displaying 751 - 775 of 2125

Streamlining the Additive Manufacturing Digital Spectrum: A Systems Approach

October 18, 2014
Author(s)
Duck B. Kim, Paul Witherell, Robert R. Lipman, Shaw C. Feng
Additive Manufacturing (AM) provides great potential for industrial manufacturers who require low volume and functional, highly complex end use products. Given AM's potential, numerous research efforts are underway to reduce the time and improve the

A Cybersecurity Testbed for Industrial Control Systems

October 9, 2014
Author(s)
Richard Candell, Keith A. Stouffer, Dhananjay Anand
The National Institute of Standards and Technology (NIST) is developing a cybersecurity testbed for industrial control systems (ICS). The goal of this testbed is to measure the performance of an ICS when instrumented with cybersecurity protections in

An improved L1 based algorithm for standardized planar datum establishment

October 1, 2014
Author(s)
Craig M. Shakarji, Vijay Srinivasan
This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a convex

Toward Manufacturing System Composability Analysis: A Use Case Scenario

September 20, 2014
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Nenad Ivezic, Yunsu Lee
One of the characteristics of a smart manufacturing system is the ability to quickly adapt to new and changing requirements. This implies that software and hardware components of the manufacturing system need to be easily composed and recomposed. In

Obstacle Detection and Avoidance from an Automated Guided Vehicle

September 18, 2014
Author(s)
Roger V. Bostelman, William P. Shackleford, Geraldine S. Cheok
Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then stops

PMML in Manufacturing Applications

September 12, 2014
Author(s)
Yung-Tsun T. Lee, Juyeon Lee
In manufacturing, an enormous amount of data, both real and simulation data, is being continuously generated. The appropriate information, if extracted from big data, could provide insights on increasing sustainability, productivity, flexibility, and

Selective Area Growth of Ga- and N-polar GaN Nanowire Arrays on Non-Polar Si (111) Substrates

September 7, 2014
Author(s)
Matthew D. Brubaker, Shannon M. Duff, Todd E. Harvey, Paul T. Blanchard, Alexana Roshko, Aric W. Sanders, Norman A. Sanford
This study presents a technique for obtaining Ga- and N-polar Gallium Nitride nanowire (GaN NW) arrays on non-polar Si (111) substrates by use of polarity-controlled AlN/GaN buffer layers. AlN films are demonstrated to adopt Al-/N-polarity for N-/Al-rich

New AGV Capabilities are Safety Driven

September 3, 2014
Author(s)
Roger V. Bostelman, William P. Shackleford
Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then stops

Sustainability Characterization for Additive Manufacturing

August 21, 2014
Author(s)
Kevin W. Lyons, Satyandra K. Gupta
Additive manufacturing (AM) has the potential to create geometrically complex parts that require a high degree of customization, using less material and producing less waste. Recent studies have shown that AM can be an economically viable option for use by

Toward Metamodels for Composable and Reusable Additive Manufacturing Process Models

August 12, 2014
Author(s)
Paul W. Witherell, Shaw C. Feng, Timothy Simpson
Despite the existence and interest in additive manufacturing (AM) for many decades, industry adoption of AM technologies has been relatively slow. Recent advances in modeling and simulation of AM processes and materials are providing new insights to help

Performance Metrics for Evaluating Object and Human Detection and Tracking Systems

July 30, 2014
Author(s)
Afzal A. Godil, Roger Bostelman, William P. Shackleford, Tsai H. Hong, Michael O. Shneier
In this report, we provide an overview of various performance evaluation metrics for object detection and tracking for robot safety applications in smart manufacturing. We present four different types of performance evaluation metrics based on detection

Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields

July 23, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, James C. Booth, David R. Novotny, James A. Liddle, Pavel Kabos
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To

Safety and Performance Standard Developments for Automated Guided Vehicles

July 23, 2014
Author(s)
Roger V. Bostelman, Tsai H. Hong, Roger D. Eastman
The American National Standards Institute/Industrial Truck Standards Development Foundation (ANSI/ITSDF) B56.5 Safety Standard committee for automated guided vehicles (AGVs) has been considering several changes to improve the standard. Of interest to the

Testing System of IEEE 1451.5-802.11 Standard-based Wireless Sensors

July 21, 2014
Author(s)
Kang B. Lee, Yuyin Song, Frederick M. Proctor
The hierarchical architecture of factory equipment networks consists of the factory level, cell level, and device level. The equipment at different levels of the factory networks may employ different network communication protocols. The challenges that

A Stiffness Model for Control and Analysis of a MEMS Hexapod Nanopositioner

July 9, 2014
Author(s)
Hongliang Shi, Hai-Jun Su, Nicholas Dagalakis
This paper presents a stiffness based kinematic model for analysis and control of a MEMS flexure-based hexapod nanopositioner that was previously built by the National Institute of Standards and Technology (NIST). This nanopositioner is capable of
Displaying 751 - 775 of 2125