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Displaying 776 - 800 of 882

Dynamic behavior of dagger-shaped atomic force microscope cantilevers

October 20, 2004
Author(s)
K Shen, Donna C. Hurley, J Turner
Experimental techniques based on the atomic force microscope (AFM) have been developed for characterizing mechanical properties at the nanoscale and applied to a variety of materials and structures. Atomic force acoustic microscopy (AFAM) is one such

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Semiconductor Nanocrystal Probes for Human Metaphase Chromosomes

February 1, 2004
Author(s)
Yan Xiao, Peter E. Barker
Novel inorganic fluorophores called semiconductor nanocrystals have recently been incorporated into protein, antibody and microbead oligonucleotide detection methods where previously, organic dyes were universally employed. To improve quantitation of

Nanometrology - FY 2003 Program and Selected Accomplishments

December 15, 2003
Author(s)
Clare M. Allocca, Stephen W. Freiman
The emphasis on nanotechnology around the world is leading to the development and commercialization of unique products based upon significantly smaller devices and material ensembles. Materials at the nanoscale in three dimensions (NEMS, MEMS), two

Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance

June 1, 2003
Author(s)
R M. Verkouteren, C E. Allison, S A. Studley, K J. Leckrone
We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sample size

Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer

June 1, 2003
Author(s)
Yong-Gu Lee, Kevin W. Lyons, Thomas W. LeBrun
In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physics are

Physics Laboratory: 2002 Activities, Accomplishments and Recognition

February 1, 2003
Author(s)
Jonathan E. Hardis, William R. Ott, G G. Wiersma
This report summarizes the research and measurement science carried out during calendar year 2001 in the NIST Physics Laboratory. The Laboratory supports U.S. industry, government, and the scientific community by providing measurement services and research

Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions

January 1, 2003
Author(s)
N Jin, A T. Rice, P R. Berger, P E. Thompson, C Rivas, R Lake, S Sudirgo, J J. Kempisty, B Curanovic, S L. Rommel, K D. Hirschman, S K. Kurinec, P Chi, David S. Simons, S.J. Chung
Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio (PVCR)

Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams

January 1, 2003
Author(s)
John G. Gillen, Albert J. Fahey
At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002
Author(s)
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a

Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction

September 1, 2002
Author(s)
Jennifer R. Verkouteren, Eric S. Windsor, Joseph M. Conny, R L. Perkins, J T. Ennis
A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interfere
Displaying 776 - 800 of 882