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Displaying 801 - 825 of 2125

A Simulated Sensor-based Approach for Kit Building Applications

December 20, 2013
Author(s)
Zeid Kootbally, Craig I. Schlenoff, Theodore J. Weisman, Stephen B. Balakirsky, Thomas R. Kramer, Anthony Pietromartire
Kit building or kitting is a process in which individually separate but related items are grouped, packaged, and supplied together as one unit (kit). This paper describes advances in developing sensing/control and parts detection technologies enabling

Does Your SEM Really Tell the Truth? - How would you know? Part 1

December 16, 2013
Author(s)
Michael T. Postek, Andras Vladar
The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantitative

Additive Manufacturing Technical Workshop Summary Report

December 4, 2013
Author(s)
Christopher U. Brown, Joshua Lubell, Robert R. Lipman
This report summarizes the presentations, discussions, and recommendations from the Additive Manufacturing Technical Workshop held during the PDES, Inc. offsite meeting in Gaithersburg, Maryland in March of 2013. The purpose of the workshop was to identify

Preface: Ubiquitous Robotics (UBIROBOTS): Workshop at the UBICOMP 2012 Conference

November 30, 2013
Author(s)
Craig I. Schlenoff, Edson Prestes, Abdelghani Chibani, Yacine Amirat
Ubiquitous robots (UBIROBOTS) are smart software or physical service providers within ambient intelligence environments. The integration of these robots within cloud computing and ubiquitous computing technologies will enhance our daily lives. Ubiquitous

TOWARDS THE SYNTHESIS OF PRODUCT KNOWLEDGE ACROSS THE LIFECYCLE

November 21, 2013
Author(s)
Paul W. Witherell, Boonserm Kulvatunyou, Sudarsan Rachuri
Product lifecycle management is an important aspect of today’s industry, as it serves to facilitate information exchange and management between most, if not all, stages of a product’s existence. As exchanged product information is inevitably subjected to

Componentization in the Systems Modeling Language

November 20, 2013
Author(s)
Conrad E. Bock
This paper describes new capabilities in the Systems Modeling Language that reduce the complexity of specifying systems through componentization, and increase the range of systems that can be specified. Modelers can identify portions of components

Toward the Ideal of Automating Production Optimization

November 15, 2013
Author(s)
John L. Michaloski, Frederick M. Proctor, Jorge Arinez, Jonatan Berglund
The advent of improved factory data collection offers a prime opportunity to continuously study and optimize factory operations. Although manufacturing optimization tools can be considered mainstream technology, most U.S. manufacturers do not take full

Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects

November 13, 2013
Author(s)
Norman A. Sanford, David R. Diercks, Brian Gorman, R Kirchofer, Kristine A. Bertness, Matthew D. Brubaker
The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in

Proposed E57.02 Range Measurement Performance Standard for Medium Range 3D Imaging Systems

November 11, 2013
Author(s)
David MacKinnon, Luc Cournoyer, Kamel Saidi, Geraldine Cheok, Robert Bridges, Darin Ingimarson
We present the proposed standard ASTM E57.02 "Test Method to Evaluate the Range Measurement Performance of 3D Imaging Systems in the Medium Range" (Work Item ASTM WK12373). The stated purpose of the standard is to provide metrics and procedures to evaluate

A Methodology for Handling Standards Terminology for Sustainable Manufacturing

October 30, 2013
Author(s)
Anantha Narayanan Narayanan, David J. Lechevalier, Katherine C. Morris, Sudarsan Rachuri
In order to develop the discipline of sustainable manufacturing, the language of discourse needs to be properly and clearly communicated, for both manufacturers and consumers. As a result a range of information standards that define the needed terminology

Three-dimensional deep sub-wavelength defect detection using (lambda) = 193 nm optical microscopy

October 25, 2013
Author(s)
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Andras Vladar, Richard M. Silver, Abraham Arceo
Identifying defects in photolithographic patterning is a persistent challenge in semiconductor manufacturing. Well-established optical methods in current use are jeopardized by upcoming sub-20 nm device dimensions. Volumetric processing of focus-resolved

Towards Mobile Manipulator Safety Standards

October 24, 2013
Author(s)
Jeremy A. Marvel, Roger V. Bostelman
We present an overview of the current safety standards for industrial robots and automated guided vehicles (AGVs), and describe how they relate to the safety concerns of mobile manipulators (robot arms mounted on mobile bases) in modern manufacturing

A Literature Review of Sensor Ontologies for Manufacturing Applications

October 23, 2013
Author(s)
Craig I. Schlenoff, Tsai Hong Hong, Roger D. Eastman
The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of a new

Economics of the U.S. Additive Manufacturing Industry

August 14, 2013
Author(s)
Douglas Thomas
There is a general concern that the US manufacturing industry has lost competitiveness with other nations. Additive manufacturing may provide an important opportunity for advancing US manufacturing while maintaining and advancing US innovation. Additive

NIST Ontological Visualization Interface for Standards: User’s Guide

August 1, 2013
Author(s)
David J. Lechevalier, Anantha Narayanan Narayanan, Katherine C. Morris, Sean Reidy, Sudarsan Rachuri
The NIST Ontological Visualization Interface for Standards (NOVIS) was developed at the National Institute of Standards and Technology (NIST) to provide an interactive visual interface to the terminology used in a variety of standards related to
Displaying 801 - 825 of 2125