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Displaying 801 - 825 of 1721

Wetting Behavior on Microscale Wrinkled Surfaces

January 1, 2007
Author(s)
Jun Y. Chung, Christopher M. Stafford
We present a systematic study of the wetting behavior on the anisotropic microstructure having a simple sinusoidal profile. The micro-patterned surface was generated by using the buckling-based technique, and its wetting properties were examined by contact

High Temperature Superconductor Wires and Tapes

November 26, 2006
Author(s)
M. P. Paranthaman, V Selvamanickam, K Matsumoto, Luigia Gianna, Wei-xian Zhang, P Goyal, Winnie Wong-Ng
High Temperature Superconductor Wires and Tapes was one of the MS&T2006 symposia (October 15-19, 2006; Duke Energy Center, Cincinnati, Ohio) that covered recent advances in the area of high temperature superconductor (HTS) wires and tapes. The symposium

The Influence of NH 3 Anneal on the Crystallization Kinetics of HfO 2 Gate Dielectric Films

November 17, 2006
Author(s)
Patrick S. Lysaght, Joseph Woicik, Brendan Foran, Joel Barnett, Gennadi Bersuker, B H. Lee
HfO2 gate dielectric thin films have been exposed to anneal processing in NH3 and N2 ambient in order to decouple the influence of N incorporation from that of the thermal cycle alone. We report on the effectiveness of NH3 processing to introduce N into

Role of Indenter Material and Size in Veneer Failure of Brittle Layer Structures

October 24, 2006
Author(s)
Sanjit Bhowmick, Juan J. Melendez-Martinez, Ilja Hermann, Yu Zhang, Brian R. Lawn
The roles of indenter material and size in the failure of brittle veneer layers in all-ceramic crown-like structures are studied. Glass veneer layers 1 mm thick bonded to alumina layers 0.5 mm thick on polycarbonate bases (representative of porcelain

Combinatorial Study of Ni-Ti-Pt Ternary Metal Gate Electrodes on HfO 2 for the Advanced Gate Stack

October 2, 2006
Author(s)
Kao-Shuo Chang, Martin L. Green, John S. Suehle, Eric M. Vogel, Hao Xiong, Jason Hattrick-Simpers, Ichiro Takeuchi, O Famodu, K Ohnaka, T Chikyow, Prashant Majhi, B H. Lee, M Gardner
We have fabricated combinatorial Ni-Ti-Pt ternary metal gate thin film libraries on HfO2 using magnetron co-sputtering, to investigate flat-band voltage shift (DVfb) and leakage current density (JL) variations. Wavelength dispersive spectroscopy (WDS)

Role of Core Support Material in Veneer Failure of Brittle Layer Structures

September 26, 2006
Author(s)
Ilja Hermann, Sanjit Bhowmick, Brian R. Lawn
A study is made of veneer failure by cracking in all-ceramic crown-like layer structures. Model trilayers consisting of a 1 mm thick external glass layer (veneer) joined to a 0.5 mm thick inner stiff and hard ceramic support layer (core) by epoxy bonding
Displaying 801 - 825 of 1721