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Displaying 901 - 925 of 1845

Optical Characterization of Oligo (phenylene-ethynylene) Self-Assembled Monolayers on GoldMonolayers on Gold

July 27, 2004
Author(s)
Lee J. Richter, Clayton S. Yang, P T. Wilson, Christina A. Hacker, Roger D. van Zee, J J. Stapleton, D L. Allara, Yuxing Yao, J M. Tour
Vibrationally resonant sum frequency generation (VR-SFG) and spectroscopic ellipsometry (SE) have been used to characterize self-assembled monolayer films of unsubstituted and mononitro substituted oligo(phenylene-ethynylene) molecules on vapor deposited

Quantifying Uncertainty in Nuclear Analytical Measurements

July 1, 2004
Author(s)
Lloyd A. Currie
This document resulted from a request at an International Atomic Energy Agency Consultants' Meeting. Information is based on a document Foundationsand future of detection and quantification limits prepared for the 1996 Proceedings of the Joint Statistical

Gas Flowmeter Calibrations with the 34 L and 677 L PVTt Standards

June 23, 2004
Author(s)
John D. Wright, Aaron N. Johnson, Michael R. Moldover, Gina M. Kline
This document provides a description of the 34 L and 677 L pressure, volume, temperature, and time (PVTt) primary gas flow standards operated by the National Institute of Standards and Technology (NIST) Fluid Flow Group. These facilities are used to

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion
Displaying 901 - 925 of 1845