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Search Publications

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Displaying 926 - 950 of 2125

Contour Metrology using Critical Dimension Atomic Force Microscopy

April 9, 2012
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Andras Vladar, Bin Ming, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental instrument for contour measurement and verification. However, although data from CD-AFM is

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Ground Truth for Evaluating 6 Degrees of Freedom Pose Estimation Systems

March 28, 2012
Author(s)
Jeremy Marvel, Joseph Falco, Tsai H. Hong
Systems developed to estimate poses of objects in 6 degrees of freedom (6DOF) Cartesian space (X, Y, and Z coordinates plus roll, pitch, and yaw) are reliant on the vendors' own processes to determine performance and measurement accuracy. These practices

2011 Solutions in Perception Challenge Performance Metrics and Results

March 22, 2012
Author(s)
Jeremy Marvel, Tsai H. Hong, Elena R. Messina
The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers at

Emergency Response Robot Evaluation Exercise

March 22, 2012
Author(s)
Adam S. Jacoff, Hui-Min Huang, Ann Virts, Anthony Downs, Raymond Sheh
More than 60 robot test methods are being developed by a team lead by the National Institute of Standards and Technology (NIST) with the sponsorship of U.S. Department of Homeland Security (DHS). These test methods are being specified and standardized

Functional Requirements of a Model for Kitting Plans

March 22, 2012
Author(s)
Stephen B. Balakirsky, Zeid Kootbally, Thomas R. Kramer, Rajmohan Madhavan, Craig I. Schlenoff, Michael O. Shneier
Industrial assembly of manufactured products is often performed by first bringing parts together in a kit and then moving the kit to the assembly area where the parts are used to assemble products. Kitting, the process of building kits, has not yet been

Performance Evaluation of Robotic Knowledge Representation (PERK)

March 22, 2012
Author(s)
Craig I. Schlenoff, Sebti Foufou, Stephen B. Balakirsky
In this paper, we explore some ways in which symbolic knowledge representations have been evaluated in the past and provide some thoughts on what should be considered when applying and evaluating these types of knowledge representations for real-time

Traceable Calibration of a Critical Dimension Atomic Force Microscope

March 9, 2012
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Craig D. McGray, John E. Bonevich, Jon C. Geist
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force

An Analysis of Solver-Based Simulation Tools

March 7, 2012
Author(s)
Ion Matei, Conrad E. Bock
Computer-interpretable representations of systems’ structure and behavior are at the center of designing today’s complex systems. Engineers create and review such representations using (graphical) modeling languages that support specification, analysis

Catalyst-free GaN Nanowires as Nanoscale Light Emitters

March 1, 2012
Author(s)
Kristine A. Bertness, Norman A. Sanford, John B. Schlager, Alexana Roshko, Todd E. Harvey, Paul T. Blanchard, Matthew D. Brubaker, Andrew M. Herrero, Aric W. Sanders
Catalyst-free growth of GaN nanowires with molecular beam epitaxy produces material of exceptionally high quality with long minority carrier lifetimes and low surface recombination velocity. The nanowires grow by thermodynamic driving forces that enhance

VCI Simulation with Semiconductor Device Models: Test Report

February 29, 2012
Author(s)
John S. Villarrubia
JMONSEL, an electron beam imaging simulator, has been modified to permit conducting regions of a sample to be designated as unconnected to an external source or sink of charge (floating) or, alternatively, to be connected with a user-specified relaxation

A Bibliography of Ambulance Patient Compartments and Related Issues

February 27, 2012
Author(s)
Mehdi Dadfarnia, Yung-Tsun T. Lee, Deogratias Kibira
Safety in the patient compartment of ambulances is an issue of growing concern for emergency medical technicians (EMTs), paramedics, patients, and others affected by ambulances. A lot of research has been conducted by different players and much of it is

Control of Molecular Mass Distributions in Enzymatic Lactone Polymerizations

February 2, 2012
Author(s)
Santanu S. Kundu, Peter M. Johnson, Kathryn L. Beers
Using a model developed for the enzyme catalyzed polymerization and degradation of poly(caprolactone), we illustrate methods and the kinetic mechanisms necessary to improve molecular mass distributions by manipulating equilibrium reactions in the kinetic

New Capabilities for Interaction Modeling in BPMN 2.0

January 15, 2012
Author(s)
Conrad E. Bock, Stephen White
Interaction models capture how businesses interact with customers and each other to provide products and services. The trend toward combinations of products and services increases the complexity of interactions beyond the capacity of conventional business

A Semantic Product Modeling Framework and Its Application for Behavior Evaluation

January 9, 2012
Author(s)
Jae H. Lee, Steven J. Fenves, Conrad E. Bock, Sudarsan Rachuri, Hyo-Won Suh, Xenia Fiorentini, Ram D. Sriram
Supporting different stakeholder viewpoints across the product’s entire lifecycle requires semantic richness to represent product related information and thus enable multi-view engineering simulations. This paper proposes a multi-level product modeling

A METHOD FOR DETERMINING THE ENVIRONMENTAL FOOTPRINT OF INDUSTRIAL PRODUCTS USING SIMULATION

December 14, 2011
Author(s)
Erik Lindskog, Linus Lundh, Jonatan K. Berglund, Yung-Tsun Lee, Anders Skoogh, Bjorn Johansson
Effective assessment and communication of environmental footprint is increasingly important to process development and marketing purposes. Traditionally, static methods have been applied to analyze the environmental impact during a product's life cycle
Displaying 926 - 950 of 2125