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Displaying 1001 - 1025 of 1560

Stripline Resonator for Electromagnetic Measurements of Materials

February 23, 1999
Author(s)
Chriss A. Jones, Y. Kantor, John H. Grosvenor Jr, Michael D. Janezic
A stripline resonator was used to measure the relative dielectric and magnetic properties of materials in the frequency range from 150 MHz to 2 GHz. Measurement accuracy relates strongly to the dimensions of the resonator. Consequently, equations used in

Complex Permittivity Determination from Propagation Constant Measurements

February 1, 1999
Author(s)
Michael D. Janezic, Jeffrey A. Jargon
This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated

Metal-Insulator-Semiconductor Transmission Lines

February 1, 1999
Author(s)
Dylan F. Williams
This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investigates

The NIST Microwave Power Standards in Waveguide

February 1, 1999
Author(s)
J. W. Allen, Fred R. Clague, N T. Larsen, M. P. Weidman
The National Institute of Standards and Technology (NIST) microwave power standards in waveguide consist of automated microcalorimeters and associated transfer standards. Each transfer standard is a bolometric dc substitution power detector (a thermistor

Evaluation of the NASA Langley Research Center Mode-Stirred Chamber Facility

January 1, 1999
Author(s)
John M. Ladbury, Galen H. Koepke, Dennis G. Camell
We performed extensive tests on three mode-stirred (reverberation) chambers operated by the High Intensity Radiation Laboratory located at the National Aeronautics and Space Administration Langley Research (NASA/LaRC) in Hampton, VA.

Characterization and Applications of On-Wafer Diode Noise Sources

December 1, 1998
Author(s)
Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

Dipole Moments of Weak, Electrically Small Emitters from TEM-Cell Measurements

December 1, 1998
Author(s)
David A. Hill, Kenneth H. Cavcey
This report presents a new method for determining the equivalent electric and magnetic dipole moments of an electrically small emitter from TEM-cell measurements. The electric dipole moments are determined from open-circuit measurements, and the magnetic

High Frequency Limitations of the JEDEC 123 Guideline

October 1, 1998
Author(s)
Dylan F. Williams
Abstract: This paper assesses certain systematic high frequency measurement errors inherent in the procedures described in the JEDEC 123 Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters.
Displaying 1001 - 1025 of 1560