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Displaying 1176 - 1200 of 1560

Assessment of Particular Measurement Data by a Linear Transfer Function Technique

October 1, 1994

Author(s)

Dennis G. Camell, M T. Ma

Dielectric Properties of Single Crystals of Al2O3, LaAlO3, NdGaO3, SrTiO3, and MgO at Cryogenic Temperatures

October 1, 1994

Author(s)

Richard G. Geyer, Jerzy Krupka, M. Kuhn, J. Hinken

Effective Medium Theory for Ferrite-Loaded Materials

October 1, 1994

Author(s)

Richard G. Geyer, J. F. Mantese, James R. Baker-Jarvis

Proposed Analysis of RCS Measurement Uncertainty

October 1, 1994

Author(s)

Ronald C. Wittmann, Michael H. Francis, Lorant A. Muth, R L. Lewis

A Bibliography of the NIST Electromagnetic Fields Division Publications

September 1, 1994

Author(s)

Ruth-Marie Lyons

A Dual-Frequency Millimeter-Wave Radiometer Antenna for Airborne MISC Sensing of Atmosphere and Ocean

September 1, 1994

Author(s)

M. D. Jacobson, L. S. Fedor, D. A. Hazen, W. B. Madsen, Michael H. Francis, D P. Kremer

Aperture Excitation of Electrically Large, Lossy Cavities

August 1, 1994

Author(s)

David A. Hill, M T. Ma, Arthur Ondrejka, Billy F. Riddle, M. L. Crawford, Robert T. Johnk

Developing a NIST Coaxial Microwave Power Standard at 1 mW

August 1, 1994

Author(s)

Fred R. Clague, Jolene D. Splett

Measurements of Shielding Effectiveness and Cavity Characteristics of Airplanes

July 1, 1994

Author(s)

David A. Hill, M. L. Crawford, Robert T. Johnk, Arthur Ondrejka, Dennis G. Camell

A Method to Determine the Calorimetric Equivalence Correction for a Coaxial Microwave Microcalorimeter

June 1, 1994

Author(s)

Fred R. Clague

Accurate Computations of Radar Cross Sections of Simple Objects

June 1, 1994

Author(s)

Lorant A. Muth, John M. Gary

Dielectric Properties of Materials at Cryogenic Temperatures and Microwave Frequencies

June 1, 1994

Author(s)

Richard G. Geyer, Jerzy Krupka

Distribution of Dielectric Relaxation Times and the Moment Problem

June 1, 1994

Author(s)

James R. Baker-Jarvis, Michael D. Janezic

Microwave Characterization of Printed Circuit Transmission Lines

June 1, 1994

Author(s)

Roger Marks, Dylan Williams

On-Wafer Impedance Measurement on Lossy Substrates

June 1, 1994

Author(s)

Dylan F. Williams, Roger Marks

This paper introduces a new method for measuring impedance parameters in transmission lines fabricated on lossy or dispersive dielectrics. The method, which uses an independent calibration to provide an impedance reference, compares well with conventional