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Displaying 1201 - 1225 of 2125

Towards Information Networks to Support Composable Manufacturing

October 15, 2008
Author(s)
Mahesh Mani, Albert W. Jones, Jun H. Shin, Ram D. Sriram
Rigid, supply-chain organizational structures are giving way to highly dynamic collaborative partnerships. These partnerships will develop rapidly by composing global manufacturing resources in response to open market opportunities; and, they will disband

Tradeoffs in Building a Generic Supply Chain Simulation Capability

October 15, 2008
Author(s)
Sanjay Jain
Building a simulation model for any large complex sys-tem requires high expertise and effort. These requirements can be reduced through building generic simulation capability that includes artifacts for facilitating the development of the simulation model

Contactless Differential Conductivity Detection

October 12, 2008
Author(s)
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis

October 1, 2008
Author(s)
Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne
Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the

Using uncalibrated lasers as wavelength standards

October 1, 2008
Author(s)
Jack A. Stone Jr.
The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary from its central value by more than a few parts in 106. The uncertainty of the gas laser

Performance Evaluation of Laser Trackers

September 15, 2008
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
The American Society for Mechanical Engineers (ASME) recently released the ASME B89.4.19 Standard [1] on performance evaluation of spherical coordinate instruments such as laser trackers. At the National Institute of Standards and Technology (NIST), we can

Accuracy Considerations for Critical Dimension Semiconductor Metrology

September 9, 2008
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, B Bunday, J Allgair
As the size of integrated circuit features continues to decrease, the accuracy of measurements becomes more important. Due to greater emphasis on precision rather than accuracy, many of the measurements made in semiconductor fabs are not traceable to the

NIST Microform Calibration System for Rockwell Hardness Standardization

August 25, 2008
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell hardness tests, microform geometric errors of the diamond indenter are a major contributor. The microform calibration of Rockwell diamond indenters has been one of the key steps for Rockwell hardness standardization

Performance of Super-Resolution Enhancement for Flash LADAR Data

August 21, 2008
Author(s)
Tsai Hong Hong, Shuowen Hu, S. S. Young
Flash laser detection and ranging (LADAR) systems are increasingly used in robotics applications for autonomous navigation and obstacle avoidance. Their compact size, high frame rate, wide field of view, and low cost are key advantages over traditional

Cellulose Nanocrystals the Next Big Nano-thing?

August 6, 2008
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H. Wegner
Biomass surrounds us from the smallest alga to the largest redwood tree. Even the largest trees owe their strength to a newly-appreciated class of nanomaterials known as cellulose nanocrystals (CNC). Cellulose, the world s most abundant natural, renewable

Metrology at the Nanoscale: What are the Grand Challenges?

August 6, 2008
Author(s)
Kevin W. Lyons, Michael T. Postek
Nanometrology provides the means to measure and characterize nanometer scale process and product performance and covers an expanse of topics including instrumentation, measurement methods (off-line and in-process applications), and standards. To meet the

Natural Gas Flow Calibration Service

August 1, 2008
Author(s)
Aaron N. Johnson
This document describes NIST's high pressure natural gas flow calibration service (NGFCS). Flow calibrations are conducted offsite at the Colorado Experimental Engineering Station Incorporated (CEESI) in Garner, Iowa. A parallel array of nine turbine meter

Simulated SEM Images for Resolution Measurement

July 30, 2008
Author(s)
Petr Cizmar, Andras Vladar, Bin Ming, Michael T. Postek
Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special ''resolution'' samples and there are several

REPRESENTING LAYOUT INFORMATION IN THE CMSD SPECIFICATION

July 9, 2008
Author(s)
Frank H. Riddick, Yung-Tsun T. Lee
Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem today. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the

Topography Measurements for Determining the Decay Factors in Surface Replication

July 4, 2008
Author(s)
Jun-Feng Song, P Rubert, Xiaoyu A. Zheng, Theodore V. Vorburger
The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwide ballistics measurement traceability and measurement quality

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

July 1, 2008
Author(s)
Joshua Lubell, Sudarsan Rachuri, Eswaran Subrahmanian, Mahesh Mani
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

A Real World Pilot implementation of the Core Manufacturing Simulation Information Model

June 23, 2008
Author(s)
Swee K. Leong, Marcus Johansson, Bj?rn Johansson, Yung-Tsun T. Lee, Frank H. Riddick
While software for discrete event simulation (DES) has emerged into sophisticated tools for decision support in a wide range of contexts, the need to integrate DES tools with other applications is increasing. In the industrial engineering context
Displaying 1201 - 1225 of 2125