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Displaying 1201 - 1225 of 1560

LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines

December 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is extended, without significant loss of measurement accuracy, to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards

Verification of Commercial Probe-Tip Calibrations

December 1, 1993
Author(s)
Roger Marks, Dylan F. Williams
We present results of a verification procedure useful in evaluating the accuracy of probe-tip scattering parameter measurements. The procedure was applied to calibrations and measurements performed in industrial laboratories. Actual measurement

Accurate Transmission Line Characterization

August 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
This letter introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance

Reciprocity Relations in Waveguide Junctions

July 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
The Lorentz reciprocity condition is applied to junctions composed of reciprocal media which connect uniform but otherwise arbitrary waveguides. An expression relating the forward and reverse transmission coefficients is derived and factored into two terms
Displaying 1201 - 1225 of 1560