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Displaying 1226 - 1250 of 2125

Modeling and Simulation for Sustainable Manufacturing

June 11, 2008
Author(s)
Deogratias Kibira, Charles R. McLean
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious natural resources are dwindling. These reports are sounding an alarm that we need to change the

An Ontological Modeling Platform

June 4, 2008
Author(s)
V.C. Liang, Conrad E. Bock, XuanFang Zha
The Ontological Modeling Platform described in this paper is a class library for extended ontological operations, to support extension of ontology languages, composition of interconnected elements, and high-level product modeling services, such as

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008
Author(s)
Gordon A. Shaw
Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires an instrument capable of piconewton-level force measurement. The atomic force microscope (AFM)

Design And Fabrication Of MJTCs On Quartz Substrates At NIST

June 1, 2008
Author(s)
Thomas E. Lipe Jr., Joseph R. Kinard Jr., Luciana Scarioni
Wet and dry etching are employed in the fabrication of new planar, thin-film multijunction thermal converters (MJTCs) on quartz membranes and crystalline quartz chips at NIST. The use of crystalline quartz as a material for the membrane and for the chip

Towards a Multi-View Semantic Model for Product Feature Description

May 28, 2008
Author(s)
Patrick Hoffmann, Shaw C. Feng, Gaurav Ameta, Parisa Ghodous, Lihong Qiao
Multiple perspectives need to be included in a product development process. Engineers from different departments usually have different views on a product design. It is hence necessary to define information structures that support multiple views. We

ER Simulation Prototypes for Incident Management Training

May 19, 2008
Author(s)
Guodong Shao, Charles R. McLean
First responders and incident management personnel need better training resources to prepare for future disasters. Live training exercises while valuable are often very expensive to organize and conduct. Training using modeling, simulation, and gaming

Relating Taxonomies with Regulations

May 13, 2008
Author(s)
Chin P. Cheng, Jiayi Pan, Gloria T. Lau, Kincho H. Law, Albert T. Jones
Increasingly, taxonomies are being developed for a wide variety of industrial domains and specific applications within those domains. These taxonomies attempt to represent formally the vocabularies commonly used by domain practitioners. These formal

Gauge Blocks - A Zombie Technology

May 1, 2008
Author(s)
Theodore D. Doiron
Gauge blocks have been the primary method for disseminating length traceability for over 100 years. Their longevity was based on two things: it was relatively inexpensive to deliver very high accuracy to users, and the technical limitation that the range

Mode-selective acoustic spectroscopy of trigonal piezoelectric crystals

May 1, 2008
Author(s)
Ward L. Johnson, Carlos F. Martino, Sudook A. Kim, Paul R. Heyliger
A noncontacting electromagnetic-acoustic-resonance technique is presented for generating and detecting vibrational modes with prescribed symmetries in piezoelectric trigonal crystals with cylindrical geometry. This technique provides the experimental basis

PIE: An Online Prediction System for Protein-Protein Interactions from Text

April 17, 2008
Author(s)
Sun Kim, Soo-Yong Shin, In-Hee Lee, Soo-Jin Kim, Ram D. Sriram, Byoung-Tak Zhang
bio-text mining area, since the PPI information is critical for understanding biological processes. However, there are very few open systems available on the Web and most of the systems focus on keyword searching based on prede¯ned PPIs. PIE (Protein

Physical characterization methods for iron-oxide contrast agents encapsulated within a targeted liposome-based delivery system

April 16, 2008
Author(s)
John A. Dagata, Natalia Farkas, Cindi L. Dennis, Robert D. Shull, Vincent A. Hackley, Charles W. Yang, Kathleen F. Pirollo, Esther H. Chang
Intact liposome-based targeted nanoparticle delivery systems (NDS) are immobilized by nonselective binding and characterized by scanning probe microscopy (SPM) in a fluid imaging environment. The size, size distribution, functionality, and stability of an

A Taxonomy of Homeland Security Modeling, Simulation, and Analysis Applications

April 14, 2008
Author(s)
Charles R. McLean, Sanjay Jain, Yung-Tsun T. Lee
The effective use of modeling, simulation, and analysis (MSA) applications could greatly enhance our ability to carry out the homeland security mission. These applications can be used to evaluate vulnerabilities in the nation s critical infrastructure as

A Layered Approach to Semantic Similarity Analysis of XML Schemas

April 7, 2008
Author(s)
Jaewook Kim, Boonserm Kulvatunyou, Nenad Ivezic, Albert W. Jones
One of the most critical steps to integrating heterogeneous e-Business applications using different XML schemas is schema mapping, which is known to be costly and error-prone. Past schema mapping research has not fully utilized semantic information in the

Long Term Sustainment Workshop Report

March 26, 2008
Author(s)
Joshua Lubell, Mahesh Mani, Eswaran Subrahmanian, Sudarsan Rachuri
This report summarizes the presentations, discussions and recommendations of a workshop held at the National Institute of Standards and Technology (NIST) on April 24-25, 2007. The purpose of the workshop was to identify policies of digital preservation and

Programs of the Manufacturing Engineering Laboratory (2005 - 2008)

March 26, 2008
Author(s)
Lisa J. Fronczek, Bessmarie A. Young
The National Institute of Standards and Technology s Manufacturing Engineering Laboratory (MEL) promotes innovation and the competitiveness of U.S. manufacturing through measurement science, measurement services, and critical technical contributions to

Towards Accurate Feature Shape Metrology

March 22, 2008
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, J Allgair
Over the last few years, the need for shape metrology for process control has increased. A key component of shape metrology is sidewall angle (SWA). However, few instruments measure SWA directly. The critical dimension atomic force microscope (CD-AFM) is

Engineering Informatics: Introduction to the Special Issue

March 1, 2008
Author(s)
Sudarsan Rachuri, Eswaran Subrahmanian
Computer-aided design, intelligent CAD, engineering analysis, collaborative design support, computer-aided engineering, and product lifecycle management are some of the terms that have emerged over the last 50 years of computing in engineering

The Potentials of Helium Ion Microscopy for Semiconductor Process Metrology

February 6, 2008
Author(s)
Michael T. Postek, Andras Vladar
Semiconductor manufacturing is always looking for more effective ways to monitor and control the manufacturing process. Helium Ion Microscopy (HIM) presents a new approach to process monitoring which has several potential advantages over the traditional

Line Width Measurement Technique Using Through-Focus Optical Images

January 1, 2008
Author(s)
Ravikiran Attota, Richard M. Silver, Ronald G. Dixson
We present a detailed experimental study of a new through-focus technique to measure line width (CD) with nanometer sensitivity using a bright field optical microscope. This method relies on analyzing intensity gradients in optical images at different

Nano- and Atomic-Scale Length Metrology

December 14, 2007
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi G. Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu
Displaying 1226 - 1250 of 2125