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Displaying 126 - 150 of 189

A Semantic Product Modeling Framework and Its Application for Behavior Evaluation

January 9, 2012
Author(s)
Jae H. Lee, Steven J. Fenves, Conrad E. Bock, Sudarsan Rachuri, Hyo-Won Suh, Xenia Fiorentini, Ram D. Sriram
Supporting different stakeholder viewpoints across the product’s entire lifecycle requires semantic richness to represent product related information and thus enable multi-view engineering simulations. This paper proposes a multi-level product modeling

Future SC4 Architecture PWI - Report and Technical Discussion

October 1, 2010
Author(s)
Allison Barnard Feeney
This document is the report of the Future SC4 architecture PWI. It provides information about the draft “Industrial Data Integrated Ontologies and Models (IDIOM) architecture specification” created by the PWI. The work of the Preliminary Work Item (PWI)

Ontological Product Modeling for Collaborative Design

July 22, 2010
Author(s)
Conrad E. Bock, XuanFang Zha, Hyo-won Suh, Jae H. Lee
This paper shows how to combine ontological and model-based techniques in languages that facilitate collaborative design exploration. The proposed approach uses ontology to capture alternative designs and incremental refinements that meet requirements and

A Semantic Product Modeling Framework and Language for Behavior Evaluation

April 8, 2010
Author(s)
Jae H. Lee, Hyo Won Suh, Steven J. Fenves, Sudarsan Rachuri, Xenia Fiorentini, Ram D. Sriram, Conrad E. Bock
Supporting different stakeholder viewpoints across the product's entire lifecycle requires semantic richness for representing product related information. This paper proposes a multi-layered product modeling framework that enables stakeholders to define

Ontological Product Modeling for Collaborative Design

October 30, 2009
Author(s)
Conrad E. Bock, XuanFang Zha, Hyo W. Suh, Jae H. Lee
This paper presents a product modeling language for collaborative design that has the benefits of ontology and expanded capabilities in conventional product modeling. The proposed approach uses ontology to increase flexibility and accuracy in combining

Information Management Gaps for Board Fabrication and Assembly

September 1, 2009
Author(s)
Eric D. Simmon, Jeff Pettinato
There are a number of driving forces that are impacting the information management needs of the board fabrication and assembly segments. The electronics industry is expanding beyond traditional industry boundaries at the same time it is shifting to a

System Builders Manual for Version 2.1.5 of the NIST DMIS Test Suite

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
This is a system builders manual for the NIST DMIS Test Suite, version 2.1.5. The purpose of the manual is to help system builders use software provided in the test suite for building systems that implement DMIS (the Dimensional Measuring Interface

Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files for

Expanding Environmental Information Management: Meeting Future Requirements

April 25, 2009
Author(s)
John V. Messina, Eric D. Simmon
The environmental impact of product manufacturing, use, and disposal has become a worldwide concern. Laws and regulations designed to protect human health and the environment are being established throughout the global community. In addition to regulatory

Descriptive Metadata Requirements for Long-term Archival of Digital Product Models

February 25, 2009
Author(s)
Joshua Lubell, Ben Kassel, Sudarsan Rachuri
Digital product engineering information comes from a variety of applications ranging from computer-aided design, engineering, and manufacturing software to product data and lifecycle management systems. As the volume of digital engineering data increases

Manufacturing Interoperability Program, a Synopsis

February 24, 2009
Author(s)
Sharon J. Kemmerer
Started in 2005, the Manufacturing Interoperability Program has seen an investment of roughly 25-30 full-time staff who have researched, developed, and deployed standards, tools, techniques, and testing environments --- helping manufacturing enterprise

Development Life Cycle for Semantically Coherent Data Exchange Specification

December 1, 2008
Author(s)
Boonserm Kulvatunyou, Katherine C. Morris, Simon P. Frechette
In enterprise integration, a data-exchange specification is an architectural artifact that evolves along with the business. Maintaining a coherent, data-exchange, semantic model is an important, yet non-trivial task. A coherent, semantic model of data-

An Evaluation of Description Logic for the Development of Product Models

November 10, 2008
Author(s)
Xenia Fiorentini, Sudarsan Rachuri, Hyo Won Suh, Jae H. Lee, Ram D. Sriram
The languages and logical formalisms developed by information scientists and logicians concentrate on the theory of languages and logical theorem proving. These languages, when used by domain experts to represent their domain of discourse, most often have

User's Guide for the Quality of Design Testing Tool and the Content Checker

November 5, 2008
Author(s)
Katherine C. Morris, Simon P. Frechette, Puja Goyal, Joshua Lubell, Boonserm Kulvatunyou, Salifou Sidi Malick, Nicolas Brayard, Severin Tixier
This document describes the operation and usage of the Quality of Design and the Content Checker Testing Tools. These tools were developed at the National Institute of Standards and Technology (NIST) to support people in developing standards for the

Scanning Probe Microscopy for Dielectric and Metal Characterization

June 10, 2008
Author(s)
Joseph J. Kopanski, Thomas R. Walker
The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different. Intermittent contact scanning capacitance microscopy (IC-SCM) is a useful technique for

Understanding EuP and REACH

June 10, 2008
Author(s)
John V. Messina, Eric D. Simmon
There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product manufacturing. In the global economy, with its distributed supply chain, local environmental laws may affect

Understanding the IPC 175X Data Model

May 1, 2008
Author(s)
Eric D. Simmon, John V. Messina
More and more political bodies (countries, states, and unions) are enacting legislation designed to protect the environment from the impact of manufacturing. One category of restrictive legislation is called Extended Producer Responsibilities (EPR). The

THE FAST INITIAL THRESHOLD VOLTAGE SHIFT: NBTI OR HIGH-FIELD STRESS

April 27, 2008
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle
Recent 'NBTI' studies have come to involve very high electric fields, yet these same studies are used to criticize the lower field 'NBTI' models. This study examines both high- and low-field degradation phenomena by monitoring the initial threshold voltage

Information management for Environmental Concerns

February 8, 2008
Author(s)
Eric D. Simmon, John V. Messina, Kevin G. Brady
Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials ending up in landfills to manufacturing process chelmicals causing health problems are causing

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

September 1, 2007
Author(s)
Joshua Lubell, Eswaran Subrahmanian, Mahesh Mani, Sudarsan Rachuri
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

Collaborative Augmented Reality for Better Standards

August 15, 2007
Author(s)
Matthew L. Aronoff, John V. Messina
Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex -- including not only textual descriptions, but CAD models, diagnostic data, process control data, and
Displaying 126 - 150 of 189