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Displaying 1351 - 1375 of 2125

Part-part Relations in an RDF/S and OWL Extension

September 1, 2006
Author(s)
Conrad E. Bock
This describes an extension to the Resource Description Framework/Schema (RDF/S) to specify relations between parts of the same whole (composite structure). For example, the relation between engine and wheels in a car applies in each individual car, rather

A Validation Architecture for Advanced Interoperability Provisioning

August 1, 2006
Author(s)
Nenad Ivezic, Edward J. Barkmeyer Jr., Boonserm Kulvatunyou, Albert W. Jones, Pat Snack, Zuran Marjanovic, Hyunbo Cho
We describe an architecture to validate new tools in support of interoperability provisioning processes that take place within industrial communities. We start from a best-practices standards development process where an industry community develops

An Infrastructure to Support Performance Analysis in Complex Systems

August 1, 2006
Author(s)
Man-Sze Li, A S. Deshmukh, Albert T. Jones
Systems research efforts have increased in a variety of disciplines. Despite these efforts, it is still difficult to predict long-term performance and to understand the relationship between the performance of the parts and the performance of the whole. The

Evaluating Suitability for Replacement of an Integrated Software Component

August 1, 2006
Author(s)
Boonserm Kulvatunyou, B Jeong, Hyunbo Cho, Nenad Ivezic, Albert W. Jones
An evaluation of the compatibility of a software component is based typically only on a vendor?s presentation. This means that end users select a software component only based on high-level matches of functional requirements. This can result in an

Feature Technology and Ontology for Embedded System Design and Development

August 1, 2006
Author(s)
XuanFang Zha, Ram D. Sriram
In this paper, we present our recent effort on using a feature technology and ontology for embedded systems modeling and design. We present an overview of embedded system design and propose an object-oriented UML modeling approach to representing embedded

NIST Calibration Services for Water Flowmeters Water Flow Calibration Facility

August 1, 2006
Author(s)
Iosif I. Shinder, Iryna V. Marfenko
This document describes the Water Flow Calibration Facility (WFCF) at the National Institute of Standards and Technology (NIST). This facility has three parallel pipelines with diameters of 100, 200 and 400 mm and three weighing systems with capacities of

The Evaluation of Ontologies

August 1, 2006
Author(s)
Leo Obrst, Benjamin Ashpole, Werner Ceusters, Mahesh Mani, Steven R. Ray, Bradford Smith
Recent years have seen rapid progress in the development of ontologies as semantic models intended to capture and represent aspects of the real world. There is, however, great variation in the quality of ontologies. If ontologies are to become

Probe-Based Micro-Scale Manipulation and Assembly Using Force Feedback

June 26, 2006
Author(s)
Jason J. Gorman, Nicholas Dagalakis
Repeatable manipulation and assembly of micro-scale components is a critical capability for future developments in opto-electronics, hybrid microelectromechanical systems, and the integration of nano-scale devices into larger systems. This paper focuses on

A Web Service-Based Reconfigurable Testbed for Business-to-Business (B2B) Integration

June 1, 2006
Author(s)
B Jeong, Jungyub Woo, Hyunbo Cho, Boonserm Kulvatunyou, James Lee
Several types of standards and corresponding software solutions have been created to enable business-to-business (B2B) integration. Testing for conformance and interoperability among these solutions are inter-dependent. This signifies the needs to make

Implementing XML Schema Naming and Design Rules

June 1, 2006
Author(s)
Joshua Lubell, Boonserm Kulvatunyou, Katherine C. Morris, Betty Harvey
We are building a methodology and tool kit for encoding XML schema Naming and Design Rules (NDRs) in a computer-interpretable fashion, enabling automated rule enforcement and improving schema quality. Through our experience implementing rules from various

Representation of Heterogeneous Material Properties in the Core Product Model

June 1, 2006
Author(s)
Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D. Sriram
The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components with

Special Issue on Collaborative Engineering

June 1, 2006
Author(s)
Ram D. Sriram, Simon Szykman, D Durham
Design of complex engineering systems is increasingly becoming a collaborative task among designers or design teams that are physically, geographically, and temporally distributed. The complexity of modern products means that a single designer or design

User Interface of Simulation of the Shipbuilding Operations

June 1, 2006
Author(s)
Guodong Shao, Charles R. McLean, Swee K. Leong
This paper discusses the development of the user interface for a simulation of the shipbuilding operations. It presents an overview of a generic simulation of shipbuilding operations, the simulation system's user profiles, and the user interface screen

Damping mechanisms for precision applications in UHV environment

May 1, 2006
Author(s)
Sumanth B. Chikkamaranahalli, R. R. Vallance, Bradley N. Damazo, Richard M. Silver
Surface analysis techniques such as scanning probe microscopy (SPM) have undergone significant advances and are attractive for application to electron and optical devices such as micro lenses, vacuum tubes, electron tubes, etc. For surface stability

Manufacturing Interoperability

May 1, 2006
Author(s)
Steven R. Ray, Albert T. Jones
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA ABSTRACT: As manufacturing and commerce become ever more global in nature, companies are increasingly dependent upon the efficient and effective exchange of information with their

Experience in the Exchange of Procedural Shape Models Using ISO 10303 (STEP)

March 30, 2006
Author(s)
Mike Pratt, Junhwan Kim
The international standard ISO 10303 (STEP) is being extended to permit the exchange of procedurally defined shape models, with additional parameterization and constraint information, between CAD systems. The transfer of parameterized assembly models is an

Bias Reduction in Roughness Measurement through SEM Noise Removal

March 24, 2006
Author(s)
R Katz, C D. Chase, R Kris, R Peltinov, John S. Villarrubia, B Bunday
The importance of Critical Dimension (CD) roughness metrics such as Line and Contact edge roughness (LER, CER) and their associated width metrics (LWR, CWR) have been dealt with widely in the literature and are becoming semiconductor industry standards
Displaying 1351 - 1375 of 2125