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Displaying 1651 - 1675 of 2606

Defining Units in the Quantum SI

February 18, 2008
Author(s)
Peter J. Mohr
Possible changes to the International System of Units (SI) are being discussed, including a proposal to define the units by specifying the values of a set of fundamental constants. This note is meant to be an elementary guide to the algebra associated with

The Potentials of Helium Ion Microscopy for Semiconductor Process Metrology

February 6, 2008
Author(s)
Michael T. Postek, Andras Vladar
Semiconductor manufacturing is always looking for more effective ways to monitor and control the manufacturing process. Helium Ion Microscopy (HIM) presents a new approach to process monitoring which has several potential advantages over the traditional

Line Width Measurement Technique Using Through-Focus Optical Images

January 1, 2008
Author(s)
Ravikiran Attota, Richard M. Silver, Ronald G. Dixson
We present a detailed experimental study of a new through-focus technique to measure line width (CD) with nanometer sensitivity using a bright field optical microscope. This method relies on analyzing intensity gradients in optical images at different

International Legal Metrology Organizational Primer

December 31, 2007
Author(s)
S. W. Stiefel
The world's metrology and legal metrology infrastructure abounds with organizations that play differing roles such as measurement research, standards, and accreditation. Associated with these organizations is a bewildering assortment of acronyms. This

Nano- and Atomic-Scale Length Metrology

December 14, 2007
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi G. Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu

NIST HB-1A Energy Efficient Lighting - Solid State Luminaires

December 7, 2007
Author(s)
C Cameron Miller, Lawrence I. Knab, Ambler Thompson, Jon M. Crickenberger
NIST Handbook 150-1A presents technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Energy Efficient Lighting/Solid State luminaires program. It is intended for

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton
The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology. Two major instruments are being used for traceable measurements. The first is a custom in-house metrology AFM, called the calibrated AFM (C

Spring constant calibration of AFM cantilevers with a piezosensor transfer standard

September 24, 2007
Author(s)
Eric Langlois, Gordon A. Shaw, John A. Kramar, Jon R. Pratt, Donna C. Hurley
We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and accompanying electronics. The piezosensor was calibrated before use

Instrumentation, Metrology, and Standards for Nanomanufacturing

September 10, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over the

The Helium Ion Microscope: A New Tool for Nanotechnology and Nanomanufacturing

September 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over the

Measurement Science and Technology for Ceramics Innovations

July 31, 2007
Author(s)
Debra L. Kaiser, Robert F. Cook
Innovations in ceramic technologies are often driven by the discovery and introduction of a material with novel or improved behavior that enables realization of a superior component, device or system. Over the past few decades, advanced ceramic materials

In-Situ Investigation of Water Transport in an Operating PEM Fuel Cell Using Neutron Radiography: Part 2 - Transient Water Accumulation in an Interdigitated Cathode Flow Field

July 27, 2007
Author(s)
Jon P. Owejan, T Trabold, David L. Jacobson, D Baker, Daniel S. Hussey, Muhammad D. Arif
An interdigitated cathode flow field was tested in-situ with neutron radiography to measure the water transport through the porous gas diffusion layer in a PEM fuel cell. Constant current density to open circuit cycles were tested and the resulting liquid

Bias and the Limits of Pooling for Large Collections

July 17, 2007
Author(s)
C E. Buckley, Darrin L. Dimmick, Ian Soboroff, Ellen M. Voorhees
Modern retrieval test collections are built through a process called pooling in which only a sample of the entire document set is judged for each topic. The idea behind pooling is to find enough relevant documents such that when unjudged documents are

Collaborative Augmented Reality for Better Standards

July 1, 2007
Author(s)
Matthew L. Aronoff, John V. Messina
Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex, the quality of the standards used to move and understand that information likewise becomes more and

The Polarizability of Helium and Gas Metrology

June 22, 2007
Author(s)
James W. Schmidt, R Gavioso, E May, Michael R. Moldover
Using a quasi-spherical, microwave cavity resonator, we measured the refractive index of helium to deduce its molar polarizability A ε in the limit of zero density. We obtained (A ε,meas - A ε,theory)/A ε = (-1.8plus or minus} 8.4)× 10 -6, where the
Displaying 1651 - 1675 of 2606