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Displaying 1726 - 1750 of 1845

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989
Author(s)
John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion depth

Microchemical and Molecular Dating

March 1, 1989
Author(s)
Lloyd A. Currie, T. W. Stafford, A. E. Sheffield, George A. Klouda, Stephen A. Wise, Robert A. Fletcher, D. J. Donahue, A.J.T. Jull, T. W. Linick

A method for the synthesis of pyrrolidine

July 5, 1988
Author(s)
Anzor I. Mikaia, George A. Kliger, OA Lesik, EV Marchevskaya, VP Rijikov, Sergai Loktev
Reaction gas chromatography–mass spectrometry is applied to establish optimal conditions for the synthesis of … Further optimization of the reaction was carried out in a pilot plant

A method for the synthesis of bi- and polycyclic hydrocarbons

March 5, 1987
Author(s)
Anzor I. Mikaia, Leonid S. Glebov, Vladimir G. Zaikin, Alexey Yatsenko, OA Lesik, George A. Kliger, Sergai Loktev
Reaction gas chromatography–mass spectrometry is applied to establish optimal conditions for the synthesis of bi- and polycyclic hydrocarbons. Further optimization of the reaction was carried out in a pilot plant.
Displaying 1726 - 1750 of 1845