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Displaying 1751 - 1775 of 2608

The development of procedures for impact testing

February 1, 2006
Author(s)
Thomas A. Siewert, Christopher N. McCowan
This report provides a broad overview of the progress in procedural improvements for impact testing. It includes a short summary of early developments, a discussion of topics that have been the subject of recent research, and a description of the

A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers

January 1, 2006
Author(s)
Arvind K. Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta
The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user interface

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M. Libert, Susan M. Ballou, B Bachrach, K Bogart
Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a NIST (National Institute of Standards and

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Xiaoyu Alan Zheng, Hyug-Gyo Rhee, John M. Libert, Li Ma, K Bogart, Susan M. Ballou, B Bachrach
Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a National Institute of Standards and Technology

Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology

January 1, 2006
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber Deflection Probe, functions by optically imaging the stem from two orthogonal directions a few

Fiber Deflection Probe for Small Hole Metrology

January 1, 2006
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This paper presents the development of a new probing method for Coordinate Measuring Machines (CMM) to inspect diameter and form of small holes. The technique, referred to as fiber deflection probing, can be used for holes of approximately 100 mm nominal

Fiber Deflection Probe Uncertainty Analysis for Micro Holes

January 1, 2006
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have recently reported on a new probe, the Fiber Deflection Probe (FDP), for diameter and form measurement of large aspect ratio micro-holes (100 um nominal diameter, 5 mm deep). In this paper, we briefly review the measurement principle of the FDP

International Comparison of Surface Roughness and Step Height (Depth) Standards, SIM 4.8

January 1, 2006
Author(s)
K Doytchinov, F Kornblit, C C. Castellanos, J C. Oliveira, Thomas Brian Renegar, Theodore V. Vorburger
Calibration services of 5 countries from the SIM region are compared through measurements of surface roughness and step height standards. A surface roughness standard with a nominal Ra value of 0.2 mm, a surface roughness standard with a nominal Ra value

Large-Scale Metrology Instrument Performance Evaluations at NIST

January 1, 2006
Author(s)
William T. Estler, Daniel S. Sawyer, Bruce R. Borchardt, Steven D. Phillips
The ASME B89 Committee on Dimensional Metrology has approved a new American National Standard B89.4.19 - Performance Evaluation of Laser Based Spherical Coordinate Measurement Systems. This Standard, to be published in 2006, specifies test methods for

Nano- and Atomic-Scale Length Metrology

January 1, 2006
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu
We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and specification of semiconductor devices as the dimensions of semiconductor devices shrink to the

Nano-Tip Electron Gun for the Scanning Electron Microscope

January 1, 2006
Author(s)
Andras Vladar, Zsolt Radi, Michael T. Postek, David C. Joy
Through this study the most important questions and problems associated with nano-tips and their possible applications to SEMs were investigated. These were related to the tip making procedures, the theoretical assessment of the Hitachi S-6000 critical

NIST Accomplishments in Nanotechnology

January 1, 2006
Author(s)
Michael T. Postek, Joseph J. Kopanski, David A. Wollman
This document includes a list of selected NIST accomplishments in nanotechnology for the period of fiscal years 2004 and 2005. These accomplishments are grouped into the NNI s Program Component Areas (PCAs), which are defined in the text. The NNI has

Reducing Uncertainty in Particle Size Measurement for Liquid Filter Testing

January 1, 2006
Author(s)
Barry M. Verdegan, Robert A. Fletcher
Contamination control is essential to reliable, cost-effective operation of hydraulic and engine systems. Particle counting provides the common, underlying basis for comparing filter performance and monitoring of contamination levels in hydraulic oil, lube

Relaxation Effects in Small Critical Nozzles

January 1, 2006
Author(s)
Aaron N. Johnson, C L. Merkle, Michael R. Moldover, John D. Wright
We computed the flow of four gases (He, N 2, CO 2, and SF 6) through a critical nozzle by augmenting traditional computational fluid dynamics (CFD) with a rate equation that accounts for τ relax, a species-dependent relaxation time that characterizes the

Topography Measurements and Applications

January 1, 2006
Author(s)
Jun-Feng Song, Theodore V. Vorburger
Based on auto- and cross-correlation functions (ACF and CCF), a new surface parameter called profile (or topography) difference, Ds, has been developed for quantifying differences between 2D profiles or between 3D topographies with a single number. When Ds

The History of Instrumented Impact Testing

December 15, 2005
Author(s)
M. P. Manahan, Thomas A. Siewert
Pendulum impact testing is widely known to have a history that extends back to the turn of the last century. To many researchers today, instrumentation of the impact test to acquire a load-time history, and thereby provide important data in addition to

Consumer Packaging Labeling Guide: Selling by Count

December 5, 2005
Author(s)
K M. Dresser
[Withdrawn (February 12, 2018)]This guide is intended to provide manufacturers, packers, distributors, and retailers of packaged products with information about the labeling requirements for commodities that are sold by count in the consumer marketplace

Three-dimensional Scanning Optical Tweezers

December 5, 2005
Author(s)
Thomas W. LeBrun, T W. Hwang, I Y. Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G. Dagalakis, Cedric V. Gagnon, Arvind K. Balijepalli
There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is anticipated

Analysis and Design of Parallel Mechanisms with Flexure Joints

December 1, 2005
Author(s)
Byoung H. Kang, J Wen, Nicholas Dagalakis, Jason J. Gorman
Flexure joints are frequently used in precision-motion stages and microrobotic mechanisms due to their monolithic construction. The joint compliance, however, can affect the static and dynamic performance of the overall mechanism. In this paper, we
Displaying 1751 - 1775 of 2608