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NIST Authors in Bold

Displaying 201 - 225 of 425

Niobium-silicide junction technology for superconducting digital electronics

April 1, 2010
Author(s)
David I. Olaya, Paul D. Dresselhaus, Samuel P. Benz
We present a technology based on Nb/NbxSi1-x/Nb junctions, with barriers near the metal-insulator transition, for applications in superconducting electronics (SCE) as an alternative to Nb/AlOx/Nb tunnel junctions. Josephson junctions with co-sputtered

Low-loss superconducting resonant circuits using vacuum-gap -based microwave components

March 4, 2010
Author(s)
Katarina Cicak, Dale Li, Joshua Strong, Michael S. Allman, Fabio Altomare, Adam J. Sirois, Jed D. Whittaker, Raymond W. Simmonds
We have produced high quality resonant microwave circuits through developing a vacuum-gap technology for fabricating lumped-element capacitive and inductive components. We use micromachining to eliminate amorphous dielectric materials leaving vacuum in

Superconductor Science and Technology

February 22, 2010
Author(s)
Kent D. Irwin, Michael D. Niemack, Joern Beyer, Hsiao-Mei Cho, William B. Doriese, Gene C. Hilton, Carl D. Reintsema, Daniel R. Schmidt, Joel N. Ullom, Leila R. Vale
Multiplexed superconducting quantum interference device (SQUID) amplifiers have recently enabled the deployment of kilopixel arrays of superconducting transition-edge sensor (TES) detectors on a variety of receivers for astrophysics. Existing multiplexing

Electronics for a Next-Generation SQUID-Based Time-Domain Multiplexing System

December 16, 2009
Author(s)
Carl D. Reintsema, Gene C. Hilton, Kent D. Irwin, Joseph S. Adams, Robert Baker, Simon R. Bandler, William B. Doriese, Enectali Figueroa-Feliciano, Richard L. Kelly, Caroline A. Kilbourne, F. S. Porter, Jeff Krinsky, Patrick Wikus
A decade has elapsed since the design, development and realization of a SQUID-based time-division multiplexer at NIST. During this time the system has been used extensively for low-temperature-detector-array measurements. Concurrently, there have been

Two-Body Models for Analyzing Complex Impedance

July 24, 2009
Author(s)
Douglas A. Bennett, Robert D. Horansky, Joel N. Ullom
Complex impedance is an important and widely used technique for characterizing microbolometers and microcalorimeters. Often, complex impedance data from actual devices does not fit the simple one-body model of a TES microcalorimeter. In this paper we will

Shannon Limits for Low-Temperature Detector Readout

July 20, 2009
Author(s)
Kent D. Irwin
Information theory places constraints on multiplexing large low-temperature detector arrays. We discuss these constraints, and review the state of the art of multiplexed low-temperature detector arrays. The number of detectors read out by each output

Niobium-silicide Junction technology for superconducting digital electronics

June 15, 2009
Author(s)
David I. Olaya, Paul D. Dresselhaus, Samuel P. Benz
Digital superconducting electronics (SCE), which allows for very low power consumption and fast switching speeds, are a promising technology to deliver ultra-high performance computation. Currently, the preferred technology for junctions in SCE consists of

Integrated Broadband Lumped-Element Symmetrical-Hybrid N-way Power Dividers

June 7, 2009
Author(s)
Mike Elsbury, Paul D. Dresselhaus, Samuel P. Benz, Zoya Popovic
This paper presents a monolithically-integrated, broadband, lumped-element, symmetrical-hybrid power divider centered at 20 GHz which was designed and fabricated to uniformly distribute power to arrays of Josephson junctions for superconducting voltage

1V and 10V SNS Programmable Voltage Standards for 70 GHz

June 3, 2009
Author(s)
Franz Mueller, Ralf Behr, T. Weimann, Luis Palafox, David I. Olaya, Paul Dresselhaus, Samuel Benz
Programmable Josephson voltage standards (PJVSs) in combination with fast switchable DC current sources have opened up new applications in the field of low frequency AC metrology. The growing interest in output voltages of up to 10 V initiated efforts by

Microwave Packaging for Voltage Standard Applications

June 3, 2009
Author(s)
Mike Elsbury, Charles J. Burroughs, Paul Dresselhaus, Zoya Popovic, Samuel Benz
Improvements to the packaging of Josephson Volt- age Standard (JVS) circuits have increased operating margins, reliability, and longevity of these systems. By using the "flip- chip-on-flex" technique, reliable chip and cryoprobe mounting have been

Application of the Josephson effect in electrical metrology

June 1, 2009
Author(s)
Samuel P. Benz, Blaise Jeanneret
Over the last 30 years, metrology laboratories have used the quantum behavior of the Josephson effect to greatly improve voltage metrology. The following article reviews the history and present status of the research and development Josephson voltage

High-speed Nb/Nb-Si/Nb Josephson junctions for superconductive digital electronics

December 1, 2008
Author(s)
David I. Olaya, Burm Baek, Paul Dresselhaus, Samuel Benz
Josephson junctions with cosputtered amorphous Nb-Si barriers are being developed at NIST for use in voltage standard circuits. These junctions have the potential for a wide range of applications beyond voltage standards because their electrical properties

Ultra-high resolution alpha particle spectroscopy using calorimetry

September 23, 2008
Author(s)
Robert D. Horansky, Joel N. Ullom, James A. Beall, Gene C. Hilton, Kent D. Irwin, Don Dry, Beth Hastings, Stephen Lamont, Clifford R. Rudy, Michael W. Rabin
Calorimetry has been used since the late 1700?s to measure the heat output of physical processes ranging from chemical reactions to the respiration of organisms . Calorimetry is performed by measuring the temperature change caused by heat release into a

Large sensitive-area NbN nanowire superconducting single-photon detectors fabricated on single-crystal MgO substrates

February 15, 2008
Author(s)
Shigehito Miki, Mikio Fujiwara, Masahide Sasaki, Burm Baek, Aaron Miller, Robert Hadfield, Sae Woo Nam, Zhen Wang
We report on the performance of large area NbN nanowire superconducting single-photon detectors (SSPDs). 20 x 20 υm 2 area SSPDs with 80 and 100 nm linewidths and 50% fill factor were fabricated in 4-nm-thick NbN films grown on single-crystal MgO
Displaying 201 - 225 of 425