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NIST Authors in Bold

Displaying 226 - 250 of 717

Software-defined Radio Based Measurement Platform for Wireless Networks

October 15, 2015
Author(s)
I-Chun Chao, Kang B. Lee, Rick Candell, Frederick M. Proctor, Chien-Chung Shen
There has been a dramatic push to adopting wireless networking technologies and protocols (such as 802.11, ZigBee, WirelessHART, Bluetooth, ISA100.11a, etc.) into time-critical networks. End-to-end latency is critical to many distributed applications and

Interference and Coexistence of Wireless Systems in Critical Infrastructure

July 7, 2015
Author(s)
Galen H. Koepke, William F. Young, John M. Ladbury, Jason B. Coder
We examine interference and coexistence testing issues, test methods, and the need to update and develop new test methodologies related to the use of wireless devices in critical infrastructure systems. A case study on interference is presented along with

Designing a Cyber-Physical Cloud Computing Architecture

June 2, 2015
Author(s)
Eric D. Simmon, Sulayman Sowe, Koji Zettsu
In this era of inter-connectivity where almost everybody, everything, and anything are networked, Cyber-Physical Systems (CPS) also known as the Internet of Things (IoT) have emerged as vital systems that use information systems to observe and modify the

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

June 1, 2015
Author(s)
Gustavo Avolio, Antonio Raffo, Jeffrey Jargon, Dominique Schreurs, Dylan Williams
This work focuses on the accuracy of nonlinear de-embedding applied to microwave transistor time-domain waveforms. The waveforms are acquired with a mixer-based Large-Signal Network Analyzer (LSNA) and are corrected at the transistor's reference planes by

PASSING THE BATON: Message FROM THE INCOMING EDITOR-IN-CHIEF

June 1, 2015
Author(s)
Hamid Gharavi
This incoming Editor In Chief's (EIC) message is expected to appear in the next issue of the IEEE wireless communications. The editorial team will be under the leadership of the new EIC for a period of three years.

Experimentally, How Does Cu TSV Diameter Influence its Stress State?

May 27, 2015
Author(s)
Chukwudi A. Okoro, Lyle E. Levine, Yaw S. Obeng, Ruqing Xu
In this work, an experimental study of the influence of Cu through-silicon via (TSV) diameter on stress build up was performed using synchrotron-based X-ray microdiffraction technique. Three Cu TSV diameters were studied; 3 µm, 5 µm and 8 µm, all of which

Rectangular-Waveguide Impedance

May 22, 2015
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Uwe Arz, Paul D. Hale
We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We also

Electro-thermal Simulation of 1200 V 4H-SiC MOSFET Short-Circuit SOA

May 10, 2015
Author(s)
Tam H. Duong, Jose M. Ortiz, David W. Berning, Allen R. Hefner Jr., Sei-Hyung Ryu, John W. Palmour
The purpose of this paper is to introduce a dynamic electro-thermal simulation and analysis approach for device design and short-circuit safe-operating-area (SOA) characterization using a physics-based electro-thermal Saber®* model. Model parameter

Compact Nano-Mechanical Plasmonic Phase Modulators

April 1, 2015
Author(s)
Brian S. Dennis, Michael Haftel, David Czaplewski, Daniel Lopez, Girsh Blumberg, Vladimir Aksyuk
The miniaturization of photonic devices is fundamentally limited by the index of refraction of the constituent materials if light is confined in dielectric nanostructures. By coupling electromagnetic fields to metal's free electrons plasmonic devices

Measuring a Device's Susceptibility to LTE: Preliminary Approaches

March 15, 2015
Author(s)
Jason B. Coder, John M. Ladbury
Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to

Nationwide Public Safety Broadband Network Deployment: Network Parameter Sensitivity Analysis

March 15, 2015
Author(s)
Richard A. Rouil, Antonio Izquierdo Manzanares, Camillo A. Gentile, David W. Griffith, Nada T. Golmie
The legislation included in the middle class tax relief and job creation act of 2012 established the First Responder Network Authority (FirstNet) for the purpose of deploying and running a nationwide Long Term Evolution (LTE) network for Public Safety

Measuring the Resiliency of Cellular Base Station Deployments

March 11, 2015
Author(s)
David W. Griffith, Richard A. Rouil, Antonio Izquierdo Manzanares, Nada T. Golmie
The National Public Safety Telecommunications Council (NPSTC) has defined Resiliency as the ability of a network to withstand the loss of assets and to recover quickly from such losses. How to measure the resiliency of a base station deployment is an

Widebend CTL cell to measure operating range of UHF RFID

March 5, 2015
Author(s)
Jehoon Yun, YongChae Jeong, David R. Novotny, Jeffrey R. Guerrieri
A wideband coupled transmission line (CTL) cell to measure the operating range of an UHF RFID (ORUR) is presented. Also, an ORUR test system is proposed to increase the isolation to more than 55 dB. It is shown that the ORUR measured by this proposed cell

Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment

October 15, 2014
Author(s)
Chih-Ming Wang, Catherine A. Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L. Holloway, Dylan F. Williams, Paul D. Hale
In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0

October 1, 2014
Author(s)
Chris Greer, David A. Wollman, Dean Prochaska, Paul A. Boynton, Jeffrey A. Mazer, Cuong Nguyen, Gerald FitzPatrick, Thomas L. Nelson, Galen H. Koepke, Allen R. Hefner Jr., Victoria Yan Pillitteri, Tanya L. Brewer, Nada T. Golmie, David H. Su, Allan C. Eustis, David Holmberg, Steven T. Bushby
Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110-140) directs NIST ‘‘to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperability of
Displaying 226 - 250 of 717