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Displaying 226 - 250 of 1560

Characterizing Large-Form-Factor Devices in a Reverberation Chamber

July 15, 2013
Author(s)
Catherine A. Remley, Gerrit S. van de Beek, Christopher L. Holloway, John M. Ladbury
Abstract—With new technologies such as machine-to-machine communications there is a growing need to test large-formfactor devices in reverberation chambers. The performance of the reverberation chamber can be degraded by the physical characteristics of

Sensitivity of Probes in Near-Field Spherical-Scanning Antenna Measurements

July 7, 2013
Author(s)
Ronald C. Wittmann, Michael H. Francis
We define and calculate sensitivity for several actual and simulated probes. Probe sensitivity can have a significant impact on measurement uncertainty associated with probe deconvolution in near- field, spherical scanning, antenna measurements.

Radio-Frequency and DC Electrical Characterization on a Modular MEMS Mechanical Test Platform for Nanomaterials

June 16, 2013
Author(s)
J. J. Brown, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Kristine A. Bertness, Norman Sanford, Victor Bright
In order to enable radio frequency (RF) data collection from a micromechanical system designed to strain nanomaterials, a coplanar electrical waveguide has been integrated with an actuated microscale stage. RF (100 MHz to 20 GHz) admittance measurements

Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals

June 1, 2013
Author(s)
Chukwudi A. Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S. Obeng
In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV daisy

Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis

May 28, 2013
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity in

MIMO Capacity in 2-D and 3-D Isotropic Environments

May 21, 2013
Author(s)
Ryan J. Pirkl, Catherine A. Remley
We analyze the distribution of MIMO channel capacity for different antennas in 2-D and 3-D statistically isotropic environments. These represent possible test environments that may be generated by multi-probe anechoic and reverberation chambers

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

April 25, 2013
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Partial and Internal Inductance: Two of Clayton R. Paul's Many Passions

April 23, 2013
Author(s)
Christopher L. Holloway, Edward E. Kuester
Inductance is one of the fundamental defined parameters in electromagnetics and it takes on a variety of formulations and definitions in the electromagnetic compatibility (EMC) community. The concept of inductance in its many definitions, uses and caveats

Estimating Uncertainties in Antenna Measurements

April 8, 2013
Author(s)
Michael H. Francis
We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering the measurement system (self-coparison tests). The important component sources of uncertainty in

Polymer Membranes to Quarter-Wave Match Gaussian Optics

February 18, 2013
Author(s)
Jack T. Surek, Jason B. Coder, Joshua A. Gordon, David R. Novotny
We demonstrate that a simple quarter wave match designed for 110 GHz in WR10 waveguide reduces reflected power by a factor of ten at high density polyethylene (HDPE)-air interfaces. Polytetrafluoroethylene (PTFE)-based membranes that are expanded by

Near-Field Scaning Microwave Microscope (NSMM)

December 31, 2012
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, Pavel Kabos
Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include: ferroelectric materials, ferromagnetic

Antenna-Environment Multiple Scattering in Reverberation Chamber Measurements

December 12, 2012
Author(s)
Ryan J. Pirkl, Catherine A. Remley
High-resolution synthetic aperture measurements in a reverberation chamber revealed the presence of multiple scattering between the scan antenna and the measurement environment. Casting the scan antenna-environment multiple scattering as an error term with

A frequency-bandgap waveguide controlled with metafilms composed of cubic particles

November 20, 2012
Author(s)
Sung Kim, Christopher L. Holloway, Michael D. Janezic, Kendra L. Kumley, James R. Baker-Jarvis, Edward Kuester
We present a rectangular S-band waveguide having electromagnetic bandgap properties (stopbands) controlled with sheets of metafilms composed of ceramic particles, in which we present both analytic and experimental results. Metafilms composed of TiO("d)2

A Reference Modulated Scatterer for ISO18000-6 UHF Tag Testing

November 15, 2012
Author(s)
David R. Novotny, Daniel G. Kuester, Jeffrey R. Guerrieri
We present a method for measuring Ultra-High Frequency Radio-Frequency Identification (UHF RFID) tag differential RCS that has the potential for being easier and more accurate than current and proposed methods [1-2]. This method is based on accurately

An Improved Antenna Gain Extrapolation Measurement

November 1, 2012
Author(s)
Jason B. Coder, David R. Novotny, Jeffrey R. Guerrieri, Michael H. Francis, Brian C. Stillwell
An improved antenna gain extrapolation measurement is proposed. The improved method consists of a vector network analyzer, a pair of RF optical links, and a pair of waveguide mixers. We present a detailed description of the new extrapolation measurement
Displaying 226 - 250 of 1560