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Search Publications by: David R Black ()

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Displaying 1 - 25 of 56

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021
Author(s)
Marcus Mendenhall, David R. Black, Donald Windover, James Cline
The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according to equations based on dipole scattering, also known as kinematic X-ray scattering. Although this

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

July 31, 2020
Author(s)
James Cline, Marcus Mendenhall, Joseph J. Ritter, David R. Black, Albert Henins, John E. Bonevich, Pamela S. Whitfield, James J. Filliben
This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of crystallite size from a consideration of powder diffraction line profile broadening. It consists

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020
Author(s)
David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM

THE CERTIFICATION OF STANDARD REFERENCE MATERIAL 660C FOR POWDER DIFFRACTION

January 15, 2020
Author(s)
David R. Black, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to evaluate specific aspects of instrument performance of both x-ray and neutron powder diffractometers. This report describes SRM 660c, the

Certification of Standard Reference Material 1879b Respirable Cristobalite

July 27, 2018
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Craig Brown, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1879b, the third generation

New Synchrotron X-Ray Techniques for In-Situ Deformation Studies

February 19, 2017
Author(s)
Lyle E. Levine, R Thomson, Gabrielle G. Long, David R. Black
Many types of defects contribute to local and long-range stresses and strains in materials. These include vacancies, voids, prismatic loops, interstitials, inclusions, and dislocations. In most cases, dislocations play the dominant role in minimizing long

Certification of Standard Reference Material 1878b Respirable Alpha Quartz

June 9, 2016
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1878b, the third generation

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration with NIST Standard Reference Materials

September 25, 2015
Author(s)
James P. Cline, Marcus H. Mendenhall, David R. Black, Donald A. Windover, Albert Henins
The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample

Certification of Standard Reference Material 1976b

September 15, 2015
Author(s)
David R. Black, Donald A. Windover, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation

Crystalline domain size and faulting in the new NIST SRM 1979 zinc oxide

September 6, 2013
Author(s)
James P. Cline, David R. Black, Albert Henins, John E. Bonevich, Whitfield S. Pam, Paolo Scardi, Matteo Leoni
A NIST SRM certified to address the issue of crystallite size measurement through a line profile analysis has been under development for several years. In order to prepare the feedstock for the SRM, nano-crystalline zinc oxide was produced from thermal

Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

August 6, 2012
Author(s)
David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline
Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Complementary Experimental Techniques for Multi-Scale Modeling of Plasticity

October 16, 2008
Author(s)
Lyle E. Levine, Gabrielle G. Long, David R. Black
Some recently-developed experimental techniques, such as in situ ultra-small-angle X-ray scattering (USAXS), have demonstrated a capability for measuring aspects of dislocation structure evolution that are inaccessible to other experimental methods

Investigation of Electron Hole Recombination-Activated Partial Dislocations and Their Behavior in 4H-SiC Epitaxial Layers

May 8, 2008
Author(s)
Yi Chen, Ning Zhang, M Dudley, JOSHUA CALDWELL, Kendrick Liu, ROBERT STAHLBUSH, XIANRONG HUANG, A T. Macrander, David R. Black
Electron hole recombination-activated partial dislocations in 4H silicon carbide homoepitaxial layers and their behavior have been studied using synchrotron X-ray topography and electroluminescence. Stacking faults whose expansion was activated by electron