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Displaying 26 - 50 of 51

A Standard Illumination Source for the Evaluation of Display Measurement Methods and Instruments

January 30, 2001

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno, Farshid Manoocheri

A prototype display measurement assessment transfer standard (DMATS) is being developed by the National Institute of Standards and Technology (NIST) to assist the display industry in standardizing measurement methods used to quantify and specify the

Light Measuring Device Diagnostics for the Photometric and Colorimetric Measurement of Flying-spot Displays

January 30, 2001

Author(s)

Paul A. Boynton, Edward F. Kelley

Flying-spot displays use narrow-spectrum high-power sources that scan the image across the display screen. They can provide a bright display with a large color gamut. When such displays are measured with conventional light-measuring devices (LMDs) such as

Tools and Diagnostics for Projection Display Metrology

January 1, 2001

Author(s)

Paul A. Boynton

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation. However, not everyone has access to such a facility, and not always will the light-measuring

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno

A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement methods used to quantify the performance of electronic displays. Designed as an idealized electronic

Meeting the Metrology Needs of the Microdisplay Industry

August 31, 2000

Author(s)

Paul A. Boynton, Edward F. Kelley, John M. Libert

Measuring the optical characteristics of microdisplays produce challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, they suffer the effects of veiling glare or

Diagnostics for Light Measuring Devices in Flying-spot Display Measurements

January 31, 2000

Author(s)

Paul A. Boynton, Edward F. Kelley, S. Highnote, R. Hurtado

Flying-spot displays, such as some laser projection displays, use a high-energy beam as a light source that scans the image across the display screen. Each pixel can be a narrow, high-energy pulse. When such displays are measured with convential light

Stray Light Elimination in Making Projection Display Measurements

July 1, 1999

Author(s)

Paul A. Boynton, Edward F. Kelley

Electronic front-projection display specifications are often based on measurements made in ideal darkroom conditions. However, not everyone has access to such a facility. In many environments, ambient light from other sources in the room illuminates the

Evaluation of Light Measuring Devices for Flying-Spot Display Measurements

May 1, 1999

Author(s)

Paul A. Boynton

Is the Measurement of Front-Projection Characteristics an Impossible Task

December 1, 1998

Author(s)

Paul A. Boynton, Edward F. Kelley

Specifications of electronic projection displays, such as contrast ratio, are often based on measurements made in ideal darkroom conditions. However, not everyone has access to such a facility. Stray light from other sources in the room (both direct and

Assessment of Color Measurement Systems Using Interference Filters

July 1, 1998

Author(s)

Paul A. Boynton, Eric Kelley

Spectroradiometers and tristimulus colorimeters are used in display measurements to measure color in one of several color space coordinate systems. How well these instruments can measure the color coordinates can be simply checked by using interference

Small-Area Black Luminance Measurements on White Screen Using Replica Masks

May 1, 1998

Author(s)

Paul A. Boynton, Edward F. Kelley

Luminance measurements of small areas of black pixels on white-screen backgrounds are often used as metrics in display measurements, such as character-stroke contrasts or deep modulation transfer functions. Serious errors may be made in measurements and

Assessment of Colour Measurement Systems Using Interference Filters

January 1, 1998

Author(s)

Paul A. Boynton, Edward F. Kelley

NIST Measurement Assurance Program for Resistance

November 1, 1997

Author(s)

Paul A. Boynton, June E. Sims, Ronald F. Dziuba

The National Institute of Standards and Technology (NIST) offers resistance Measurement Assurance Program (MAP) transfers at the 1 ohm and 10 k ohm levels, to provide a method of assessing and maintaining the quality of a customer's measurement process