Publications

Displaying 1 - 25 of 70

Application of the Hough Transform to Electron Energy-Loss Spectrum-Line Acquisition

October 12, 2021

Author(s)

J H. Scott, David S. Bright

We present a procedure based on the linear Hough transform for visualizing and quantitatively measuring the tilt alignment of spectrum-line datasets. By combining the transform with a simple angular translation, information about the quality of the

Certification of New Standard Reference Material 2806b Medium Test Dust in Hydraulic Oil

December 19, 2016

Author(s)

Robert A. Fletcher, Nicholas W. Ritchie, David S. Bright, James J. Filliben, William F. Guthrie

A new material has been certified to become Standard Reference Material (SRM) 2806b - Medium Test Dust in Hydraulic Fluid. SRM 2806b consists of a trace polydisperse, irregularly shaped mineral dust particles suspended in hydraulic fluid. The certified

Beam Tilt, Defocus, and Vibration Contribute to HRTEM Gate Dielectric Thickness Measurement Uncertainty

October 16, 2008

Author(s)

David S. Bright, Jake H. Scott

Using statistical design-of-experiment (DEX) methods, beam tilt, defocus, and vibration of the microscope were determined to have large effects on the absolute measurement error of gate dielectric thickness measurements by high-resolution transmission

Comment on Melkman's Convex Hull Algorithm

October 16, 2008

Author(s)

David S. Bright

The input to the elegant and simple algorithm by Melkman must not be three collinear points. Otherwise, the algorithm correctly removes collinear points.

"Derived Spectra" Software Tools for Detecting Spatial and Spectral Features in Spectrum Images

January 1, 2005

Author(s)

Dale E. Newbury, David S. Bright

Maximum Pixel Spectrum: A New Tool For Detecting And Recovering Rare, Unanticipated Features From Spectrum Image Data Cubes

November 1, 2004

Author(s)

David S. Bright, Dale E. Newbury

A new software tool, the Maximum Pixel Spectrum detects rare events within a spectrum image data cube, such as that generated with electron-excited energy dispersive x-ray spectrometry (EDS) in a scanning electron microscope. The Maximum Pixel Spectrum is

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004

Author(s)

John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman

Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Long-Range Strains and the Effects of Applied Field at 180 Ferroelectric Domain Walls in Lithium Niobate

February 1, 2004

Author(s)

Terrence J. Jach, S. Kim, J. A. Aust, S M. Durbin, David S. Bright

rroelectric domains with antiparallel polarization are readily induced in congruent LiNbO3 with electric fields above 240 kV/cm at room temperature. Even in the absence of external fields, these 180 walls exhibit wide regions of shear strain, of the order

In Vitro Biocompatibility of Hydrolytically Degraded Poly(d,l-lactic acid)

January 1, 2004

Author(s)

S Yoneda, William F. Guthrie, David S. Bright, C A. Khatri, Francis W. Wang

n order to investigate the effects of hydrolytic degradation on the biocompatibility of poly(d,l-lactic acid) [P(d,l-LA)], the initial attachment of MC3T3-E1 osteoblast-like cells on various degraded P(d,l-LA) disks was assessed. MC3T3-E1 cells were seeded

Determination of Pore-Size Distributions in Low-K Dielectric Films by Transmission Electron Microscopy

September 1, 2003

Author(s)

B J. Foran, B Kastenmeier, David S. Bright

This paper discusses methods of characterizing pore size distributions in low-k films by transmission electron microscopy (TEM), comparing both conventional TEM and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM)

The Poly Plot Package - Data Analysis Tools for Spectral Images

August 1, 2003

Author(s)

David S. Bright, John A. Small

One page abstract.

Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry

July 1, 2003

Author(s)

John G. Gillen, David S. Bright

In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CAI) from

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002

Author(s)

Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright

Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a

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