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Search Publications by: David S Bright (Assoc)

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Displaying 26 - 50 of 70

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002
Author(s)
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a

Real-Time Studies of Strains at Ferroelectric Domain Walls under an Applied Field

August 17, 2002
Author(s)
Terrence J. Jach, S. Kim, S M. Durbin, J. A. Aust, David S. Bright
We report on an improved method of visualizing domains in congruent ferroelectric crystals such as LiNbO^d3 with Bragg x-ray topography. Using monochromatic synchrotron undulator radiation and a magnifying x-ray camera, we are able to image domains created

Effects of Hydrolytic Degradation on In Vitro Biocompatibility of Poly (d,l-lactic acid)

March 1, 2002
Author(s)
S Yoneda, William F. Guthrie, David S. Bright, C A. Khatri, Francis W. Wang
Objective: In order to investigate the effects of hydrolytic degradation on the biocompatibility of poly (d,l-lactic acid) [P(d,l-LA], the initial attachment and the mitochondrial activity of MC3T3-El osteoblast-like cells on various degraded P(d,l-LA)

Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics

December 1, 2001
Author(s)
Terrence J. Jach, S M. Durbin, A S. Bakulin, David S. Bright, C B. Stagarescu, G Srajer, D. Haskel, J Pedulla
Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of view of

Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device

February 1, 2001
Author(s)
John A. Small, David S. Bright
In recent years, field-emission gun scanning electron microscopes, FEG-SEMs, with high-brightness electron guns and excellent performance at low electron beam energies (E 0 less then or equal to 5 keV) have become readily available. Concurrently the

Shape Factors of ISO 12103-A3 (Medium Test Dust)

November 1, 2000
Author(s)
Robert A. Fletcher, David S. Bright
A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both filtering