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Search Publications by: Richard S. Gates (Assoc)

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Displaying 51 - 75 of 116

Prototype Cantilevers for AFM Lateral Force Measurement

June 2, 2008
Author(s)
Richard S. Gates, Mark Reitsma
One of the major difficulties in calibrating the lateral forces measured with optical lever Atomic Force Microscopy is in determining the lateral optical lever sensitivity. Novel cantilevers have been designed and fabricated to simplify this measurement

Prototype Cantilevers for SI Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland
This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications

Use of Transfer Artifacts for Small Force Measurement

January 1, 2006
Author(s)
Gordon A. Shaw, Jon R. Pratt, Richard S. Gates, Mark Reitsma
In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In order to do this, the microfabricated cantilevers typically used for AFM force measurements