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Displaying 1 - 25 of 199

A Dynamic Uncertainty Protocol for Digital Sensor Networks

November 1, 2021
Author(s)
Michael Gaitan, Richard A. Allen, Jon Geist, Akobuije Chijioke
We propose a concept of the use of dynamic uncertainty to improve the accuracy and robustness of digital sensor networks. The digital smart transducer is integrated with a microcontroller that reads the binary data from the calibrated sensor, performs an

Accurate localization microscopy by intrinsic aberration calibration

June 24, 2021
Author(s)
Craig Copeland, Craig McGray, Robert Ilic, Jon Geist, Samuel Stavis
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard

CHARACTERIZATION OF LASER DOPPLER VIBROMETERS USING ACOUSTO-OPTIC MODULATORS

December 31, 2020
Author(s)
Michael Gaitan, Jon C. Geist, Benjamin J. Reschovsky, Akobuije Chijioke
We report on a new approach to characterize the performance of a laser Doppler vibrometer (LDV). The method uses two acousto-optic modulators (AOMs) to frequency shift the light from an LDV by a known quantity to create a synthetic velocity shift that is

Particle tracking of microelectromechanical system performance and reliability

October 25, 2018
Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Samuel M. Stavis
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions have demonstrated critical limits of performance and reliability. Here, we advance a particle tracking method to measure MEMS motion in operando at

Subnanometer localization accuracy in widefield optical microscopy

July 11, 2018
Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017
Author(s)
Craig Copeland, Craig McGray, Jon Geist, James Alexander Liddle, Robert Ilic, Samuel Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables magnification calibration with subnanometer