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Displaying 26 - 50 of 199

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

Dimensional Reduction of Duplex DNA Under Nanofluidic Slit Confinement

August 19, 2015
Author(s)
Luis Fernando Vargas Lara, Jack F. Douglas, Samuel M. Stavis, Elizabeth A. Strychalski, Jon C. Geist, Brian J. Nablo
There has been much recent interest in the dimensional properties of duplex DNA under nanoscale confinement conditions as a problem of fundamental interest in both technological and biological fields. This has led to a series of measurements by

Characterization of Electrothermal Actuation with Nanometer and Microradian Precision

June 21, 2015
Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Vladimir A. Aksyuk, Samuel M. Stavis
A recently introduced particle-tracking method was used to measure the single motion cycles of an electrothermal actuator with nanometer and microradian precision. Driving the actuator with a low-noise input induced deterministic motion that was perfectly

Reference Materials 8096 and 8097 - The MEMS 5-in-1 RMs: Homogeneous and Stable

May 14, 2014
Author(s)
Janet M. Cassard, Jon C. Geist, John A. Kramar
The NIST Microelectromechanical Systems (MEMS) 5-in-1 Reference Materials (RMs) were developed to assist users in validating their use of five documentary standard test methods. A Reference Material can be defined as a material whose property values are

Method for Measuring Axis Orthogonality in MEMS Accelerometers

July 15, 2013
Author(s)
Craig D. McGray, Muhammad Y. Afridi, Jon C. Geist
A method is described for the computation of axis orthogonality errors in 3-axis accelerometers, based on the application of gravitational force at known angles. A precision two-axis articulated gimbal system is used to control the angle at which the

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property

MEMS Kinematics by Super-Resolution Fluorescence Microscopy

September 27, 2012
Author(s)
Craig D. McGray, Samuel M. Stavis, Joshua Giltinan, Eric Eastman, Samara L. Firebaugh, Jenelle Piepmeier, Jon C. Geist, Michael Gaitan
Super-resolution fluorescence microscopy is used for the first time to study the nanoscale kinematics of a MEMS device in motion across a surface. A device under test is labeled with fluorescent nanoparticles that form a microscale constellation of near