March 29, 2007
Author(s)
Yu Lei, Raghu N. Kacker, D. Richard Kuhn, Vadim Okun, James F. Lawrence
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this