July 9, 2005
Author(s)
Dale E. Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis
Electron probe x-ray microanalysis is based upon the use of a focused, high current density electron beam, 5 keV to 30 keV in energy, to excite characteristic x-rays from a picogram mass of a solid target. X-ray spectral measurements are currently