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Search Publications by: Dale E. Newbury (Assoc)

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Displaying 26 - 50 of 216

An Iterative Qualitative - Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap Haystack

June 20, 2018
Author(s)
Dale E. Newbury, Nicholas Ritchie
When analyzing an unknown by electron-excited energy dispersive X-ray spectrometry with the entire periodic table possibly in play, how does the analyst discover minor and trace constituents when their peaks are overwhelmed by the intensity of an

EDS Microanalysis: Pushing the Limits

June 1, 2018
Author(s)
Nicholas Ritchie, Dale E. Newbury, Michael J. Mengason, Heather Lowers
It is a great time to be a microanalyst. After a few decades of incremental progress in energy dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally

Microanalysis: What Is It, Where Did It Come From, and Where Is It Going?

August 4, 2017
Author(s)
Dale E. Newbury
"Microanalysis" in the parlance of the Microanalysis Society (MAS) refers to spatially-resolved elemental and molecular analysis performed at the micrometer to nanometer to picometer scales by any combination of excitation and analytical spectrometry that

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

August 4, 2017
Author(s)
Dale E. Newbury, Nicholas W. Ritchie, Michael J. Mengason, Keana C. Scott
Elemental trace analysis by electron-excited x-ray spectrometry performed in the scanning electron microscope (SEM) with energy dispersive x-ray spectrometry (EDS) can reach a limit of detection of 0.0005 mass fraction for many elements. Exceptions include

Ti_(12.5)Zr_(21)V_(10)Cr_(8.5)Mn_(x)Co_(1.5)Ni_(46.5-x)AB_(2)-type metal hydride alloys for electrochemical storage application: Part 1. Structural characteristics

August 3, 2012
Author(s)
Leonid A. Bendersky, Ke Wang, Igor Levin, Dale E. Newbury, K. Young, B. Chao, Adam A. Creuziger
The microstructures of a series of AB_(2)-based metal hydride alloys (Ti_(12.5)Zr_(21)V_(10)Cr_(8.5)Mn_(x)Co_(1.5)Ni_(46.5-x)) designed to have different fractions of non-Laves secondary phases were studied by x-ray diffraction, scanning electron

Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence

June 1, 2011
Author(s)
Jeffrey M. Davis, Dale E. Newbury, Nicholas W. Ritchie, Edward P. Vicenzi, Dale P. Bentz, Albert J. Fahey
X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue when

Examination of Multiphase (Zr,Ti)(V,Cr,Mn,Ni)2 Ni-MH Electrode Alloys. Part 2: Solid-State Transformation of the Interdendritic B2 Phase Phase

August 15, 2010
Author(s)
Leonid A. Bendersky, Ke Wang, William J. Boettinger, Dale E. Newbury, K. Young, B. Chao
Multi-component Zr-Ti-Ni-TM (TM=V, Cr, Mn and Co) cast alloys intended for use as negative electrodes in Ni metal hydride batteries were studied to determine the solidification microstructure and solidification path in the Part I of this paper. Part II of

Solidification of a heterogeneous Multiphase Laves-based Hydrogen Storage Alloy

August 15, 2010
Author(s)
William J. Boettinger, Dale E. Newbury, Ke Wang, Leonid A. Bendersky, Chun Chiu, Ursula R. Kattner, K. Young, B. Chao
The solidification microstructure of a nine-element Zr-Ni based AB(sub 2) type C14/C15 Laves hydrogen storage alloy is determined. The selected composition represents a class of alloys being examined for usage as a metal hydride electrode in nickel metal

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the