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Displaying 176 - 192 of 192

High-Accuracy Principal-Angle Scanning Spectroscopic Ellipsometry of Semiconductor Interfaces

December 31, 1995

Author(s)

Nhan Van Nguyen, Deane Chandler-Horowitz, Joseph G. Pellegrino, Paul M. Amirtharaj

Interface Roughness Induced Changes in the Near-Eo Spectroscopic Behavior of Short-Period GaAs/AlAs Superlattices

December 31, 1994

Author(s)

Deane Chandler-Horowitz, Joseph G. Pellegrino, Nhan Van Nguyen, Paul M. Amirtharaj, S. B. Qadri

Determination of the Optical Constants of ZnSe Films by Spectroscopic Ellipsometry

July 1, 1994

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker

Spectroscopic Ellipsometry Determination of the Properties of the Thin Underlying Strained Si Layer and the Roughness at SiO 2 /Si Interface

May 16, 1994

Author(s)

Nhan Van Nguyen, Deane Chandler-Horowitz, Paul M. Amirtharaj, Joseph G. Pellegrino

Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry

December 31, 1993

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker

Interface Sharpness During the Initial Stages of Growth of Thin, Short-Period III-V Superlattices

December 31, 1993

Author(s)

Joseph G. Pellegrino, S. B. Qadri, C. M. Cotell, Paul M. Amirtharaj, Nhan Van Nguyen, J. Comas

Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry

June 1, 1993

Author(s)

Nhan Van Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G. Seiler, S. B. Qadri

Metrologic Support for the DARPA/NRL-XRL Mask Program: Ellipsometric Analyses of SiC Thin Films on Si

January 1, 1993

Author(s)

Deane Chandler-Horowitz, Nhan Van Nguyen, Jay F. Marchiando, Paul M. Amirtharaj

Interface Sharpness in Low-Order III-V Superlattices

December 31, 1992

Author(s)

Joseph G. Pellegrino, S. B. Qadri, Paul M. Amirtharaj, Nhan Van Nguyen, J. Comas