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Search Publications by: Lee J Richter (Fed)

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Displaying 126 - 150 of 150

Correlation of Molecular Orientation with Adhesion at Polystyrene/Soild Interfaces

September 1, 2002
Author(s)
P T. Wilson, Lee J. Richter, William E. Wallace, Kimberly A. Briggman, John C. Stephenson
Vibrationally resonant sum-frequency generation (VR-SFG) has been used to characterize the molecular orientation of the phenyl groups at the interface between polystyrene (PS) films and surface-modified glass substrates. Both the interface structure and

Vibrational Signatures of Polyethylene Glycol and Brighteners on Copper

February 1, 2002
Author(s)
B C. Baker, Clayton S. Yang, Lee J. Richter, Thomas P. Moffat
With the use of fourier transform infrared spectroscopy (FTIR) and sum frequency generation spectroscopy (SFG), the surface coverage and confirmation of additives often used in copper deposition are identified on copper surfaces. Ex situ experiments at

Absolute Molecular Orientational Distribution of the Polystyrene Surface

April 1, 2001
Author(s)
Kimberly A. Briggman, John C. Stephenson, William E. Wallace, Lee J. Richter
Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characterization of

Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles

March 1, 2001
Author(s)
A Liu, A Rahmani, Garnett W. Bryant, Lee J. Richter, Stephan J. Stranick
We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An external

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000
Author(s)
Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford
In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semiconductor

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images

August 1, 1999
Author(s)
Lee J. Richter, C E. Dentinger, Richard R. Cavanagh, Garnett W. Bryant, A Liu, Stephan J. Stranick, C D. Keating, M J. Natan
We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This dependence is

Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy

June 1, 1999
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses

October 15, 1998
Author(s)
Lee J. Richter, T Petralli-Mallow, John C. Stephenson
We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in parallel

High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope

July 1, 1998
Author(s)
Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is used to