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Search Publications by: David G. Seiler (Assoc)

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Displaying 1 - 25 of 166

Strategic Opportunities for U.S. Semiconductor Manufacturing

August 1, 2022
Author(s)
Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics continue to drive innovations in communications, information technology, health care, military systems

Epitaxially-grown self-assembled Bi2Se3/Bi2MnSe4 multilayer heterostructures

August 14, 2017
Author(s)
Joseph A. Hagmann, Xiang Li, Si-Ning Dong, Sergei Rouvimov, Sujitra J. Pookpanratana, Kin Man Yu, Tatyana Orlova, Curt A. Richter, David G. Seiler, Xinyu Liu, Jacek K. Furdyna, Margaret Dobrowolska
Progress in understanding topologically non-trivial systems offers the promise of predicting novel systems that demonstrate the remarkable properties associated with topological systems, such as unidirectional spin-polarized surface current and the

Interacting nanoscale magnetic cluster arrays in molybdenum oxide bronzes

May 26, 2017
Author(s)
Joseph A. Hagmann, Son T. Le, Lynn F. Schneemeyer, Joseph A. Stroscio, Tiglet Besara, Theo Siegrist, Curt A. Richter, David G. Seiler
In this study, we examine several reduced ternary molybdates in the family of rare earth molybdenum bronzes produced by electrochemical synthesis with composition LnMo16O44. These compounds contain an array of electrically isolated but magnetically

Frontiers of Characterization and Metrology for Nanoelectronics: 2017

March 20, 2017
Author(s)
Erik M. Secula, David G. Seiler
The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) has the goal of bringing together scientists and engineers interested in all aspects of the characterization and measurement technology needed for

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property