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Search Publications by: Scott A Wight (Fed)

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Displaying 26 - 50 of 92

OVERVIEW OF THE TESTING PROGRAM ON FIBERS USED IN BALLISTIC APPLICATIONS

April 4, 2012
Author(s)
Amanda L. Forster, Haruki Kobayashi, Jae H. Kim, Michael A. Riley, Joy Dunkers, Scott Wight, Kirk D. Rice, Gale A. Holmes
The goal of this paper and presentation is to give an overview of the research effort to date being conducted at the National Institute of Standards and Technology on polymeric fibers used in soft body armor (SBA) and a discussion of future directions. The

The Effects of Folding on High Strength Fibers Used in Soft Body Armor

January 23, 2012
Author(s)
Haruki Kobayashi, Walter G. McDonough, Joy Dunkers, Jae H. Kim, Hae-Jeong Lee, Scott Wight, Amanda L. Forster, Kirk D. Rice, Gale A. Holmes
Poly (p-phenylene benzobisoxazole) (PBO) fibers have been used in soft body armor (SBA) because of their high mechanical strength. However, there was an unexpected failure of a first responder's SBA which was composed of PBO fiber that was in service for

Direct Preparation of Particles From Liquid Suspension for ESEM or SEM Analysis

October 1, 2005
Author(s)
Scott A. Wight, Richard D. Holbrook
A simplified method for the preparation of particles from liquid suspensions has been developed. Particles are deposited directly on carbon planchets for rapid analysis by environmental scanning electron microscopy or by conventional scanning electron

High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials

March 21, 2005
Author(s)
Dale E. Newbury, J H. Scott, Scott A. Wight, J T. Armstrong, John A. Small
Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectrometry

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003
Author(s)
John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or cesium

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002
Author(s)
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a