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Search Publications by: Thomas A. Germer (Fed)

Displaying 301 - 325 of 384

Measurement of Roughness of Two Interfaces of a Dielectric Film by Scattering Ellipsometry

January 1, 2000

Author(s)

Thomas A. Germer

Microroughness-blind Optical Scattering Instrument

January 1, 2000

Author(s)

Thomas A. Germer

Optical Properties of Materials: A Sampling of NIST Contributions

January 1, 2000

Author(s)

Thomas A. Germer, R Gupta, Leonard M. Hanssen, Eric L. Shirley

Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes and

Polarimetric BRDF in the Microfacet Model: Theory and Measurements

January 1, 2000

Author(s)

R G. Priest, Thomas Germer

Polarized light scattering measurements of polished and etched steel surfaces, ed. by Z.H. Gu and A.A. Maradudin

January 1, 2000

Author(s)

Thomas A. Germer, T Rinder, HT Rothe

Multidetector Hemispherical Polarized Optical Scattering Instrument

July 1, 1999

Author(s)

Thomas A. Germer

A multidetector optical scattering instrument is described and characterized. The instrument has twenty-eight detectors surrounding and substantially covering the scattering hemisphere. Each detector contains a polarizer so that each is only sensitive to p

Polarized Light Scattering Measurements of Dielectric Spheres upon a Silicon Surface

July 1, 1999

Author(s)

Li Piin Sung, George W. Mulholland, Thomas Germer

The polarization of light scattered into directions out of the plane of incidence by polystyrene latex spheres upon a silicon substrate was measured for p-polarized incident light. The experimental data show good agreement with theoretical predictions for

Polarized Light Scattering Measurements of Roughness, Subsurface Defects, Particles, and Dielectric Layers on Silcon Wafers

July 1, 1999

Author(s)

Thomas A. Germer, Li Piin Sung

This article outlines theoretical and experimental results for polarized light scattering from five different sample configurations: surface roughness of a single interface, defects below a single interface, spherical particles above a single surface

Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements

June 1, 1999

Author(s)

Thomas A. Germer, Clara C. Asmail

A goniometric optical scatter instrument has been developed at the National Institute of Standards and Technology which can readily perform measurements of optical scatter and its associated polarization in directions out of the plane of incidence. In this

Polarization of Light Scattered by Microrough Surfaces and Subsurface Defects

June 1, 1999

Author(s)

Thomas A. Germer, Clara C. Asmail

The polarization of light scattered into directions out of the plane of incidence for 532 nm light incident at 45 with p-polarization was measured from rough silicon, rough titanium nitride, polished fused silica and glass ceramic, and ground and

Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements

January 1, 1999

Author(s)

Thomas A. Germer, Clara C. Asmail

Multidetector Hemispherical Polarized Light Scattering Instrument, ed. by P.T. Chen, Z.H. Gu, and A.A. Maradudin

January 1, 1999

Author(s)

Thomas A. Germer

Polarization of light scattered by microrough surfaces and subsurface defects

January 1, 1999

Author(s)

Thomas A. Germer, Clara C. Asmail