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Search Publications by: Thomas A. Germer (Fed)

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Displaying 276 - 300 of 384

Polarized Light-Scattering Measurements of Polished and Etched Steel Surfaces

July 1, 2000
Author(s)
Thomas A. Germer, T Rinder, HT Rothe
The directional dependence of the intensity and polarization of light scattered by a series of steel surfaces was measured. The samples differ by polishing procedure. Theories for light scattering from microroughness and permittivity variations are

Polarimetric BRDF in the Microfacet Model: Theory and Measurements

March 1, 2000
Author(s)
R G. Priest, Thomas Germer
A key to modeling polarimetric signatures of painted objects is the polarimetric bidirectional reflectance distribution function (BRDF). In particular, it is important to correctly capture the out-of-plane behavior of the BRDF. From the theoretical point

SCATMECH: Polarized Light Scattering C++ Class Library

March 1, 2000
Author(s)
Thomas A. Germer
A C++ object class library has been developed to distribute models for polarized light scatteringfrom surfaces. It is the intent of this library to allow researchers in the light scattering community tofully utilize the models described in several

Angular Distribution of Light Scattered From a Sinusoidal Grating

January 1, 2000
Author(s)
Egon Marx, Thomas A. Germer, Theodore V. Vorburger, B C. Park
The angular distributions of light scattered by gold-coated and aluminum-coated gratings having amplitudes of ~90 nm and periods of 6.67 ¿m were measured and calculated for light incident from a HeNe laser at an angle of 6E. Experimental results are

Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III

January 1, 2000
Author(s)
Ping-Shine Shaw, R Gupta, Thomas A. Germer, Uwe Arp, Thomas B. Lucatorto, Keith R. Lykke
The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Facility