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Search Publications by: Uwe Arp (Fed)

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Displaying 1 - 25 of 87

Influence of Spectral Bandwidth on the Working Curve in Vat Photopolymerization

April 29, 2024
Author(s)
Benjamin Caplins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Yuqin Zong, Dianne L. Poster, Callie Higgins, Jason Killgore
In vat photopolymerization, 3-dimensional parts are fabricated by using patterned light to spatially cure a liquid resin. One of the foundational measurements for vat photopolymerization is known as the working curve whereby the depth (i.e. thickness) of

Results of an Interlaboratory Study on the Working Curve in Vat Photopolymerization

March 18, 2024
Author(s)
Thomas Kolibaba, Jason Killgore, Benjamin Caplins, Callie Higgins, Uwe Arp, C Cameron Miller, Yuqin Zong, Dianne L. Poster
The working curve informs resin properties and print parameters for stereolithography, digital light processing, and other photopolymer additive manufacturing (PAM) technologies. First demonstrated in 1992, the working curve measurement of cure depth vs

Characterizing light engine uniformity and its influence on LCD-based vat photopolymerization printing

December 27, 2022
Author(s)
Benjamin Caplins, Callie Higgins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Dianne L. Poster, Clarence Zarobila, Yuqin Zong, Jason Killgore
Vat photopolymerization (VP) is a rapidly growing category of additive manufacturing. As VP methods mature the expectation is that the quality of printed parts will be highly reproducible. At present, detailed characterization of the light engines used in

Broadband Radiometric LED Measurements

September 6, 2016
Author(s)
George P. Eppeldauer, P. Yvonne Barnes, Howard W. Yoon, Leonard Hanssen, Vyacheslav B. Podobedov, Robert E. Vest, Uwe Arp, C Cameron Miller
At present, broadband radiometric measurements of LEDs with uniform and low-uncertainty results are not available. Currently, either spectral radiometric measurements or broadband photometric LED measurements are used. The broadband photometric

Calibration procedure for UV-365 integrated irradiance measurements

September 8, 2015
Author(s)
George P. Eppeldauer, Thomas C. Larason, Robert E. Vest, Uwe Arp, Howard W. Yoon
Since the CIE standardized rectangular-shape spectral response function for the 320 nm to 400 nm wavelength range can be realized only with large spectral mismatch, the realized UV-A meters have different response functions resulting in large errors in

Compact X-ray and Extreme-Ultraviolet Light Sources

July 10, 2015
Author(s)
Lahsen Assoufid, Uwe Arp, Patrick Naulleau, Sandra Biedron , William Graves
Bringing the brightness and power of vast synchrotron and free-electron laser sources to the scale of the lab and clinic marks an important next frontier—and could transform the landscape of X-ray science and technology.

IR-enhanced Si reference detectors for 1-step scale transfers from 300 nm to 1000 nm

November 20, 2014
Author(s)
George P. Eppeldauer, Thomas C. Larason, Jeanne M. Houston, Robert E. Vest, Uwe Arp, Howard W. Yoon
IR-enhanced Si photodiodes have improved radiometric and electronic characteristics as compared to other widely used Si photodiodes and can be used as responsivity standards in the wavelength range from 300 nm to 1000 nm. Their low predicted uncertainty

Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source

August 25, 2014
Author(s)
Uwe Arp, Alexander Sorokin, Ulf Jastrow, Pavle Jurani?, Svea Kreis, Mathias Richter, Yiping Feng, Dennis Nordlund, Kai Tiedtke, Philip Heimann, Bob Nagler, Hae Ja Lee, Stephanie Mack, Marco Cammarata, Oleg Krupin, Marc Messerschmidt, Michael Holmes , Michael Rowen, William Schlotter, Stefan Moeller, Joshua Turner
This paper reports novel measurements of x-ray optical radiation on an absolute scale from a recently developed source of radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the physics behind the

First Report on Quantum Dot Coated CMOS CID Arrays for the UV and VUV

December 13, 2013
Author(s)
Uwe Arp, Robert E. Vest, Zoran Ninkov, Ross Robinson, Suraj Bhaskaran
A technique has been developed for coating commercial off the shelf (COTS) detector arrays with a thin, uniform layer of quantum dots. The quantum deposition is accomplished using an Optomec Aerosol Jet rapid prototyping system. When illuminated by UV

Response of large area avalanche photodiodes to low energy X-rays

April 30, 2012
Author(s)
Thomas R. Gentile, Uwe Arp, M J. Bales, R Farrell
For an experiment to study neutron radiative beta-decay, we operated large area avalanche photodiodes (APDs) at liquid nitrogen temperature to detect X-rays with energies between 0.2 keV and 15 keV. Whereas there are numerous reports of X-ray spectrometry

SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research

September 1, 2011
Author(s)
Uwe Arp, Charles W. Clark, Lu Deng, Nadir S. Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven E. Grantham, Edward W. Hagley, Shannon B. Hill, Thomas B. Lucatorto, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest
The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storage

Synchrotron radiation-based bilateral intercomparison of ultraviolet source calibrations

July 7, 2011
Author(s)
Uwe Arp, Zhigang Li, Ping-Shine Shaw, Mathias Richter, Roman Klein, Wolfgang Paustian, Reiner Thornagel
We report on a successful bilateral inter-comparison between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST). In both laboratories deuterium lamps were calibrated using the calculability of

Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV

January 20, 2011
Author(s)
Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors were

Uniform and enhanced field emission from chromium oxide coated carbon nanosheets

April 2, 2008
Author(s)
Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon

Ultraviolet Characterization of Integrating Spheres

July 9, 2007
Author(s)
Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R. Lykke
We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was analyzed

Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III

January 1, 2007
Author(s)
Uwe Arp, Charles E. Gibson, Keith R. Lykke, Albert C. Parr, Robert D. Saunders, D J. Shin, Ping-Shine Shaw, Zhigang Li, Howard W. Yoon
A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the primary