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Search Publications by: Eric L. Shirley (Fed)

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Displaying 126 - 150 of 185

Aspects of Practical Radiometry: Terminology, Uncertainty, and Physical Optics

January 1, 2001
Author(s)
Eric L. Shirley, Raju V. Datla
We discuss efforts that have been made to help establish-in practice-a greater uniformity of nomenclature used for various terms in radiometry as well as expression of measurement uncertainty. We also discuss the role of diffraction effects, which account

1-cm Collimated Source for Use in Infrared Calibrations

July 1, 2000
Author(s)
Beverly Klemme, Timothy M. Jung, Adriaan C. Carter, Eric L. Shirley, Steven R. Lorentz, Raju V. Datla
A 1 cm collimated source has been developed and tested for calibration of detectors in the 2 m to 8 m range. This source will be used to calibrate the Transfer Radiometer (BXR) currently under development at NIST. Also, the results of the test of this

Dynamic Structure Factor of Diamond and LiF Measured Using Inelastic X-Ray Scattering

April 1, 2000
Author(s)
W A. Caliebe, J A. Soininen, Eric L. Shirley, C C. Kao, K Hamalainen
The dynamic structure factors S(q,ω) of diamond and LiF have been measured using inelastic x-ray scattering. The experimental data are compared to results of ab initio calculations, which take into account the interaction of the excited electron with the

Optical Properties of Materials: A Sampling of NIST Contributions

January 1, 2000
Author(s)
Thomas A. Germer, R Gupta, Leonard M. Hanssen, Eric L. Shirley
Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes and

The Optical Properties of Materials

January 1, 2000
Author(s)
Eric L. Shirley, J R. Chelikowsky, S G. Louie, G Martinez
This is the end material (e.g. title page, index) for the Materials Research Society Proceedings of a Symposium that the NIST author co-organized.

A Band-Structure-Based Approach to Modeling X-Ray Absorption, Fluorescence, and Resonant Inelastic Scattering

August 1, 1999
Author(s)
Eric L. Shirley, J A. Carlisle, Steven R. Blankenship, R N. Smith, L J. Terminello, J J. Jia, T A. Callcott, D L. Ederer
X-ray optical processes in solids--absorption, fluorescence and resonantscattering--are modeled within a band-structure-basedapproach to describe electron states. The theory goes beyond a simpleone-electron treatment by considering self-energy corrections