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Search Publications by: David B. Newell (Fed)

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Displaying 101 - 125 of 150

Quantum Hall effect on centimeter scale chemical vapor deposited graphene films

December 7, 2011
Author(s)
Tian T. Shen, Wei Wu, Qingkai Yu, Curt A. Richter, Randolph E. Elmquist, David B. Newell, Yong P. Chen
We report observations of well developed half integer quantum Hall effect on mono layer graphene films of 7 mm × 7 mm in size. The graphene films are grown by chemical vapor deposition on copper, then transferred to SiO2/Si substrates, with typical carrier

The New SI: The Role of CODATA

December 1, 2011
Author(s)
David B. Newell, Peter J. Mohr, Barry N. Taylor
The mission of the International Council for Science : Committee on Data for Science and Technology (CODATA ) is to strengthen international science for the benefit of society by promoting improved scientific and technical data management and use. One of

Graphene Production for Electrical Metrology

June 1, 2011
Author(s)
Randolph E. Elmquist, David B. Newell, George R. Jones, Felipe L. Marquez-Hernandez, Mariano A. Real, Tian T. Shen
Many material and electronic contributions must be favorable to produce devices with strong quantum Hall effect (QHE) plateaus that are suitable for precise resistance metrology. Even so, metrologically interesting QHE plateaus have been observed in

Microscopic Polarization in the Bilayer Graphene

April 24, 2011
Author(s)
Joseph A. Stroscio, Suyong S. Jung, Nikolai N. Klimov, David B. Newell, Nikolai B. Zhitenev, Gregory Rutter
Bilayer graphene has drawn significant attention due to the opening of a band gap in its low energy electronic spectrum, which offers a route to electronic applications that is not practical with single layer graphene. The gap can be either tunable through

Evolution of Microscopic Localization in Graphene in a Magnetic Field: From Scattering Resonances to Quantum Dots.

January 9, 2011
Author(s)
Suyong S. Jung, Gregory M. Rutter, Nikolai Klimov, David B. Newell, Irene G. Calizo, Angela R. Hight Walker, Nikolai Zhitenev, Joseph A. Stroscio
Graphene is a unique material displaying high-mobility transport in monolayer-thin films. However, its properties are strongly dependent on interactions with substrates, local charges and environment. Scanned probe microscopies can be used to locally probe

Resource Letter FC-1: The physics of fundamental constants

April 1, 2010
Author(s)
Peter J. Mohr, David B. Newell
This Resource Letter is a guide to the literature describing both experimental and theoretical work on the determination of values of certain fundamental physical constants. In this Letter, fundamental physical constants are taken to be the experimentally

The Fundamental Physical Constants: A New Set of Recommended Values of the Basic Constants and Conversion Factors of Physics and Chemistry Incorporating Recent Data Has Just Been Issued by CODATA

October 16, 2008
Author(s)
Peter J. Mohr, Barry N. Taylor, David B. Newell
The Committee on Data for Science and Technology (CODATA) was established in 1966 as an interdisciplinary committee of the International Council of scientific Unions (now International council of Science). Three years later, CODATA created the task group

CODATA recommended values of the fundamental physical constants: 2006

April 1, 2008
Author(s)
Peter J. Mohr, Barry N. Taylor, David B. Newell
The paper give the 2006 self-consistent set of values of the basic constants and conversion factors of physics and chemistry recommended by the Committee on data for Science and Technology (CODATA) for international use. Further, it describes in detail the

Precision and Accuracy of Thermal Calibration of Atomic Force Microscopy Cantilevers

January 1, 2006
Author(s)
G A. Matei, E J. Thoreson, Jon R. Pratt, David B. Newell, N A. Burnham
To have confidence in force measurements made with atomic force microscopes (AFMs), the spring constant of the AFM cantilevers should be known with good precision and accuracy, topics not yet thoroughly treated in the literature. In this study, we compared

Progress Towards SI Traceable Force Metrology for Nanomechanics

January 1, 2004
Author(s)
David B. Newell, Eric P. Whitenton, John A. Kramar, Jon R. Pratt, Douglas T. Smith
This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization and

Progress Towards Systeme International d'Unites Traceable Force Metrology for Nanomechanics

January 1, 2004
Author(s)
Jon R. Pratt, Douglas T. Smith, David B. Newell, John A. Kramar, Eric P. Whitenton
Recent experiments with the National Institute of Standards and Technology (NIST) Electrostatic Force Balance (EFB) have achieved agreement between an electrostatic force and a gravitational force of 10^(-5) N to within a few hundred pN/¿N. This result

The NIST Microforce Realization and Measurement Project

April 1, 2003
Author(s)
David B. Newell, Edwin R. Williams, John A. Kramar, Jon R. Pratt, Douglas T. Smith
The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force below

Probe-Force Calibration Experiments Using the NIST Electrostatic Force Balance

January 1, 2003
Author(s)
Jon R. Pratt, David B. Newell, John A. Kramar, J Mulholland, Eric P. Whitenton
The sensitivity of a piezoresistive cantilever force sensor has been determined by probing the weighing pan of the NIST prototype electrostatic force balance. In this experiment, micronewton contact forces between a force probe and the balance''s weighing

The NIST Microforce Realization and Measurement Project

June 1, 2002
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, Edwin R. Williams
The National Institute of Standards and Technology (NIST) has launched a five-year Microforce Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force below

The NIST Microforce Realization and Measurement Project

June 1, 2002
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, Edwin R. Williams
The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force below

NIST Electrostatic Force Balance Experiment

January 1, 2002
Author(s)
John A. Kramar, David B. Newell, Jon R. Pratt
We have designed and built a prototype electrostatic force balance for realizing forces in the micronewton range. The active electrodes are concentric cylinders, the outer serving as the reference and the inner suspended and guided by a rectilinear flexure

SI Traceability of Force at the Nanonewton Level

July 1, 2001
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams
Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five-year