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Search Publications by: Jay H. Hendricks (Fed)

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Displaying 1 - 25 of 95

The Expanding Role of National Metrology Institutes in the Quantum Era

July 12, 2022
Author(s)
Alexander Tzalenchuk, Nicolas Spethmann, Tim Prior, Jay H. Hendricks, Yijie Pan, Vladimir Bubanja, Guilherme Temporao, Dai-Hyuk Yu, Damir Ilic, Barbara L. Goldstein
Now that all base units are defined in terms of fundamental constants and can thus — at least in principle — be realized anytime and anywhere, rather than through a measurement chain leading back to unique physical artefacts, who holds the traceability

A New Spin on Kibble: A Self Calibrating Torque Realization Device at NIST

June 3, 2022
Author(s)
Zane Comden, Stephan Schlamminger, Charles Waduwarage Perera, Frank Seifert, David B. Newell, Jay H. Hendricks, Barbara L. Goldstein, Leon Chao
After the 2019 redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated weight suspended from a known lever arm. Specifically, a modification of the Kibble principle used for realizing the kilogram

DETERMINATION OF DISTORTION CORRECTIONS FOR A FIXED LENGTH OPTICAL CAVITY PRESSURE STANDARD

September 30, 2021
Author(s)
Jacob Edmond Ricker, Jay H. Hendricks, Kevin O. Douglass, Sarah White, Sergei Syssoev
Optical gas refractometry has enabled new pressure standards to be developed based on a dual Fixed Length Optical Cavity (FLOC) system. NIST in partnership with MKS Instruments has created a portable FLOC pressure standard based gas refractivity. A key

Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

September 17, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the crea-tion of deployed and often miniaturized standards. These

NIST on a Chip: Photonic and Quantum-Based Sensors for Measurements of Pressure, Vacuum, Temperature and Beyond!

April 29, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Julia Scherschligt
At the core of the NIST on a Chip (NoAC) program is the idea that measurement technology can be developed to enable metrology to be done "outside the National Metrology Institute" by virtue of deployed and often miniaturized standards (that can also serve

Transient heating in fixed length optical cavities for use as temperature and pressure standards

February 25, 2021
Author(s)
Jacob Edmond Ricker, Kevin O. Douglass, Jay H. Hendricks, Jack Stone, Sergei Syssoev, Sefer Avdiaj
Optical refractometry techniques can enable realization of both pressure and temperature directly from properties of the gas. For achieving the highest possible accuracy, temperature uniformity across the refractometer must be less than 1 mK. However, the

Excess Electrons Bound to H2S Trimer and Tetramer Clusters

January 24, 2020
Author(s)
Gaoxiang Liu, Manuel Diaz-Tinoco, Sandra M. Ciborowski, Chalynette Martinez-Martinez, Svetlana Lyspustina, Jay H. Hendricks, Vincent Ortiz, Kit H. Bowen
The hydrogen sulfide trimer and tetramer anions, (H2S)3– and (H2S)4–, were generated by Rydberg electron transfer and studied via a synergy between velocity-map imaging anion photoelectron spectroscopy and high-level quantum chemical calculations. The

Dual Cavity Refractivity measurements using a single Laser

September 15, 2019
Author(s)
Kevin O. Douglass, Jacob Edmond Ricker, Stephen Eckel, Jay H. Hendricks
We present a method for measuring refractivity-based pressure changes using a dual Fabry-Perot cavity utilizing a single laser with off-set sideband locking to the second cavity. Preliminary data illustrate the utility of the technique.

Towards Photonic based Pascal Realization as a Primary Pressure Standard

February 7, 2019
Author(s)
Jacob E. Ricker, Jay H. Hendricks, Patrick F. Egan, Jack Stone, Kevin O. Douglass, Gregory Scace
New techniques using refractometry have enabled gas pressure to be measured using laser interferometry. Two key techniques have been studied at NIST which include the Fixed Length Optical Cavity (FLOC) and the Variable Length Optical Cavity (VLOC). The

Quantum-based vacuum metrology at NIST

June 20, 2018
Author(s)
Julia K. Scherschligt, James A. Fedchak, Zeeshan Ahmed, Daniel S. Barker, Kevin O. Douglass, Stephen P. Eckel, Edward T. Hanson, Jay H. Hendricks, Thomas P. Purdy, Jacob E. Ricker, Robinjeet Singh
The measurement science in realizing and disseminating the SI unit for pressure, the pascal (Pa), has been the subject of much interest at NIST. Modern optical-based techniques for pascal metrology have been investigated, including multi-photon ionization

Recent Developments in Surface Science and Engineering, Thin Films, Nanoscience, Biomaterials, Plasma Science, and Vacuum Technology

May 31, 2018
Author(s)
Miran Mozetic, Alenka Vesel, Gregor Primc, J. Bauer, A. Eder, G. H. S. Schmid, David Ruzic, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Jay H. Hendricks, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt, Jack A. Stone Jr., Gregory F. Strouse, I. Capan, M Buljan, S. Milosevic, C Teichert, S R. Cohen, A G. Silva, M Lehocky, P Humpolicek, C Rodriguez, J Hernandez-Montelongo, E Punzon-Quijorna, D Mercier, M Manso-Silvan, G Ceccone, A Galtayries, K Stana-Kleinschek, I Petrov, J E. Greene, J Avila, C Y. Chen, B Caja, H Yi, A Boury, S Lorcy, M C. Asensio, T Gans, D O?Connell, F Reniers, A Vincze, M Anderle
Nanometer-sized structures, surfaces and sub-surface phenomena have played an enormous role in science and technological applications and represent a driving-force of current interdisciplinary science. Recent developments include the atomic-scale

Recommended practice for calibrating vacuum gauges of the ionization type

April 27, 2018
Author(s)
James A. Fedchak, Patrick J. Abbott, Jay H. Hendricks, Paul C. Arnold, Neil T. Peacock
This document represents a recommended practice for the calibration of ionization gauges using the comparison method. In this method, ionization gauges are compared to a working standard that has an SI traceable calibration. The ionization gauge is either