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Search Publications by: Samuel M. Stavis (Fed)

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Displaying 1 - 25 of 119

Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield

March 18, 2024
Author(s)
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson, Ashish Chanana, Kartik Srinivasan, Daron Westly, Robert Ilic, Marcelo Davanco, Samuel M. Stavis
In a popular integration process for quantum information technologies, localization microscopy of quantum emitters guides lithographic placement of photonic structures. However, a complex coupling of microscopy and lithography errors degrades registration

Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy

December 20, 2021
Author(s)
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland, Thomas Brian Renegar, Ronald G. Dixson, Robert Ilic, R. Michael Verkouteren, Samuel M. Stavis
Volumetric analysis of single microdroplets is difficult to perform by ensemble gravimetry, whereas optical microscopy is often inaccurate beyond the resolution limit. To address the latter issue, we advance and integrate these complementary methods

Accurate localization microscopy by intrinsic aberration calibration

June 24, 2021
Author(s)
Craig Copeland, Craig McGray, Robert Ilic, Jon Geist, Samuel Stavis
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard

Experimental Variation of Magnification Calibration for Localization Microscopy

September 15, 2019
Author(s)
Craig R. Copeland, Bojan R. Ilic, Samuel M. Stavis
We study the experimental variation of a localization microscope due to temporal and thermal factors, enabling elucidation of the discrepancy between transillumination brightfield and epi-illumination fluorescence of an aperture array for magnification

Bubble magnetometry of nanoparticle heterogeneity and interaction

June 7, 2019
Author(s)
Andrew L. Balk, Ian J. Gilbert, R. Ivkov, John Unguris, Samuel Stavis
Bubbles have a rich history as transducers in particle-physics experiments. In a solid-state analogue, we use bubble domains in nanomagnetic films to measure magnetic nanoparticles. This technique can determine the magnetic orientation of a single

Particle tracking of microelectromechanical system performance and reliability

October 25, 2018
Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Samuel M. Stavis
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions have demonstrated critical limits of performance and reliability. Here, we advance a particle tracking method to measure MEMS motion in operando at

Nanoparticle Manufacturing - Heterogeneity through Processes to Products

August 15, 2018
Author(s)
Samuel M. Stavis, Jeffrey Fagan, Michael Stopa, James Alexander Liddle
Commercial products are now making use of the unique properties of nanoscale particles. However, common challenges of making nanoparticles into products still limit their impact. In this article, we review recent advances in nanoparticle manufacturing in

Subnanometer localization accuracy in widefield optical microscopy

July 11, 2018
Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale