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Search Publications by: Samuel M. Stavis (Fed)

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Displaying 26 - 50 of 119

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017
Author(s)
Craig Copeland, Craig McGray, Jon Geist, James Alexander Liddle, Robert Ilic, Samuel Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables magnification calibration with subnanometer

Nanolithography Toolbox

October 19, 2016
Author(s)

Bojan R. Ilic, Krishna Coimbatore Balram, Daron A. Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Liya Yu, Neal A. Bertrand, Samuel M. Stavis, Vladimir A. Aksyuk, James A. Liddle, Brian A. Bryce, Nicolae Lobontiu, Yuxiang Liu, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Pavel Neuzil, Vojtech Svatos, Slava Krylov, Christopher B. Wallin, Ian J. Gilbert, Kristen A. Dill, Richard J. Kasica, Kartik A. Srinivasan, Gregory Simelgor, Juraj Topolancik

The Nanolithography Toolbox

October 19, 2016
Author(s)
Krishna Coimbatore Balram, Daron Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Richard Kasica, Christopher B. Wallin, Ian J. Gilbert, Brian A. Bryce, Gregory Simelgor, Juraj Topolancik, Nicolae Lobontiu, Yuxiang Liu, Pavel Neuzil, Vojtech Svatos, Kristen A. Dill, Neal A. Bertrand, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Kartik Srinivasan, Samuel Stavis, Vladimir Aksyuk, James Alexander Liddle, Slava Krylov, Robert Ilic
This article describes a platform-independent software package for scripted lithography pattern layout generation and complex processing. The Nanolithography Toolbox, developed at the Center for Nanoscale Science and Technology (CNST) at the National

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

Optical Tracking of Nanoscale Particles in Microscale Environments

March 10, 2016
Author(s)
Pramod Mathai, James A. Liddle, Samuel M. Stavis
The trajectories of nanoscale particles through microscale environments record useful information about both the particles and the environments. Optical microscopes provide efficient access to this information through measurements of light in the far field

Quantitative magnetometry of ferromagnetic nanorods by microfluidic analytical magnetophoresis

September 3, 2015
Author(s)
Andrew L. Balk, Lamar O. Mair, Feng Guo, Carlos M. Hangarter, Pramod Mathai, Robert D. McMichael, Samuel M. Stavis, John Unguris
We introduce an implementation of magnetophoresis to measure the absolute magnetization of ferromagnetic nanorods dispersed in fluids, by analyzing the velocity of single nanorods under an applied magnetic field gradient. A microfluidic guideway prevents

Dimensional Reduction of Duplex DNA Under Nanofluidic Slit Confinement

August 19, 2015
Author(s)
Luis Fernando Vargas Lara, Jack F. Douglas, Samuel M. Stavis, Elizabeth A. Strychalski, Jon C. Geist, Brian J. Nablo
There has been much recent interest in the dimensional properties of duplex DNA under nanoscale confinement conditions as a problem of fundamental interest in both technological and biological fields. This has led to a series of measurements by