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Search Publications by: Anthony Kos (Fed)

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Displaying 26 - 50 of 80

Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope

November 23, 2007
Author(s)
Anthony B. Kos, Donna C. Hurley
We present a new digital-signal-processor-based resonance tracking system for scanned probe microscopy (SPM) imaging. The system was developed to enable quantitative imaging of mechanical properties with nanoscale spatial resolution at practical data

Experimental determination of the inhomogeneous contribution to linewidth in Permalloy films using a time-resolved magneto-optic Kerr effect microprobe

September 12, 2007
Author(s)
Michael Schneider, Thomas Gerrits, Anthony B. Kos, Thomas J. Silva
We adapted a time-resolved magneto-optic microprobe for use with the pulsed inductive microwave magnetometer apparatus, allowing us to measure the magnetization dynamics of a thin Permalloy film at micrometer and millimeter length scales under exactly the

RFID Devices and Systems in Homeland Security Applications

July 1, 2007
Author(s)
Kate Remley, Jeffrey R. Guerrieri, Dylan Williams, David R. Novotny, Anthony B. Kos, Nelson Bryner, Nader Moayeri, Michael Souryal, Kang Lee, Steven Fick
This article reports on activities being carried out by the National Institute of Standards and Technology to ensure secure, reliable use of Radio-Frequency Identification (RFID) technology in homeland security and public safety applications. These

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

July 12, 2006
Author(s)
Donna C. Hurley, M Kopycinski-Muller, Eric Langlois, Anthony B. Kos, N. Barbosa
We have used contact-resonance-frequency atomic force microscopy techniques to nondestructively image variations in adhesion as a buried interface. Images were acquired on a sample containing a 20nm gold (Au) blanket film on silicon (Si) with a 1 nm

Large-angle magnetization dynamics measured by time-resolved ferromagnetic resonance

March 30, 2006
Author(s)
Thomas Gerrits, Michael Schneider, Anthony B. Kos, Thomas J. Silva
A time-resolved ferromagnetic resonance technique was used to investigate the nonlinear magnetization dynamics of a 10 nm thin Permalloy TM film in response to a sequence of large-amplitude field pulses. The magnetic field pulse sequence was set at a

Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM

June 1, 2005
Author(s)
Donna C. Hurley, Anthony B. Kos, Paul Rice
We describe a dynamic atomic force microscopy (AFM) method to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques previously used for quantitative

Zigzag-shaped magnetic sensors

December 13, 2004
Author(s)
Fabio C. da Silva, Willard C. Uhlig, Anthony B. Kos, Susan A. Schima, Joe Aumentado, John Unguris, David P. Pappas
Magnetism in zigzag-shaped thin-film elements is investigated using scanning electron microscopy with polarization analysis, magnetotransport measurements, and micromagnetic simulations. We find that the angle of magnetization alternates along the length

Finite coplanar waveguide width effects in pulsed inductive microwave magnetometry

July 12, 2004
Author(s)
Michael Schneider, Anthony B. Kos, Thomas J. Silva
The effect of finite coplanar waveguide (CPW) width on the measurement of the resonance frequency in thin ferromagnetic films has been characterized for pulsed inductive microwave magnetometry. A shift in resonant frequency is a linear function of the

Structure and Magnetic Switching of Thin Film HITPERM/SiO 2 Soft Magnetic Multilayers

July 4, 2004
Author(s)
Hideyuki Okumura, C Y. Um, S Y. Chu, M E. McHenry, D E. Laughlin, Anthony B. Kos
Laminated (Fe 0.7Co 0.3) 88Zr 7B 4Cu a-HITPERM/SiO 2 multilayer thin films have been previously shown to exhibit thermally activated, stepped magnetization curves associated with sequential switching of layers. A model for the thickness dependence of the