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Search Publications by: Anthony Kos (Fed)

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Displaying 26 - 50 of 54

Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM

June 1, 2005
Author(s)
Donna C. Hurley, Anthony B. Kos, Paul Rice
We describe a dynamic atomic force microscopy (AFM) method to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques previously used for quantitative

Zigzag-shaped magnetic sensors

December 13, 2004
Author(s)
Fabio C. da Silva, Willard C. Uhlig, Anthony B. Kos, Susan A. Schima, Joe Aumentado, John Unguris, David P. Pappas
Magnetism in zigzag-shaped thin-film elements is investigated using scanning electron microscopy with polarization analysis, magnetotransport measurements, and micromagnetic simulations. We find that the angle of magnetization alternates along the length

Finite coplanar waveguide width effects in pulsed inductive microwave magnetometry

July 12, 2004
Author(s)
Michael Schneider, Anthony B. Kos, Thomas J. Silva
The effect of finite coplanar waveguide (CPW) width on the measurement of the resonance frequency in thin ferromagnetic films has been characterized for pulsed inductive microwave magnetometry. A shift in resonant frequency is a linear function of the

Structure and Magnetic Switching of Thin Film HITPERM/SiO 2 Soft Magnetic Multilayers

July 4, 2004
Author(s)
Hideyuki Okumura, C Y. Um, S Y. Chu, M E. McHenry, D E. Laughlin, Anthony B. Kos
Laminated (Fe 0.7Co 0.3) 88Zr 7B 4Cu a-HITPERM/SiO 2 multilayer thin films have been previously shown to exhibit thermally activated, stepped magnetization curves associated with sequential switching of layers. A model for the thickness dependence of the

Cyrogenic pulsed inductive microwave magnetometer

May 15, 2003
Author(s)
Anthony B. Kos, John P. Nibarger, Radek Lopusnik, Thomas J. Silva, Zbigniew J. Celinski
A cryogenic pulsed inductive microwave magnetometer is used to characterize the switching dynamics in thin-film materials at low temperatures and microwave frequencies. The system is contained inside a 20-cm-dia ultrahigh vacuum chamber and cooled by a

Pulsed inductive microwave magnetometer

October 1, 2002
Author(s)
Anthony B. Kos, Thomas J. Silva, Pavel Kabos
We describe the apparatus, software, and measurement procedures for a pulsed inductive microwave magnetometer (PIMM). PIMM can measure the dynamical properties of materials used in recording heads for magnetic storage applications and it can be used as a

Vectorial second-harmonic magneto-optic kerr effect measurement

May 1, 2000
Author(s)
Pavel Kabos, Anthony B. Kos, Thomas J. Silva
A significant modification of an existing experimental technique based on the second-harmonic magneto-optical Kerr effect (SH-MOKE) is introduced. With a p-polarized pumping optical wave incident upon a magnetic film, the transverse component of

Nanosecond Magnetization Reversal in High Coercivity Thin Films

January 1, 2000
Author(s)
N D. Rizzo, Thomas J. Silva, Anthony B. Kos
We used a wide-field Kerr microscope to measure magnetization reversal in high coercivity thin film media that were subjected to nanosecond field pulses. Coplanar waveguides were used as a field source. Two different samples of CoCr 10Ta 4 were measured