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Search Publications by: Samuel P. Benz (Fed)

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Displaying 101 - 125 of 557

Measuring the Leakage Current to Ground in Programmable Josephson Voltage Standards

July 7, 2018
Author(s)
Alain Rufenacht, Charles J. Burroughs, Paul Dresselhaus, Samuel P. Benz
The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and

Radiofrequency Waveform Synthesis with the Josephson Arbitrary Waveform Synthesizer

July 7, 2018
Author(s)
Justus Brevik, Christine A. Donnelly, Nathan Flowers-Jacobs, Anna Fox, Pete Hopkins, Paul Dresselhaus, Samuel P. Benz
We have measured the frequency-dependent voltage output up to 100 MHz of a modified version of the Josephson Arbitrary Waveform Synthesizer. An impedance-matching resistor was integrated within the Josephson junction array circuit to match the nominally

Three Volt Pulse-Driven Josephson Arbitrary Waveform Synthesizer

July 7, 2018
Author(s)
Nathan Flowers-Jacobs, Alain Rufenacht, Anna Fox, Steven B. Waltman, Justus Brevik, Paul Dresselhaus, Samuel P. Benz
This paper describes a new generation of Josephson Arbitrary Waveform Synthesizers which generate ac waveforms with a root-mean-squared (rms) amplitude of 3 V over a quantum-accurate operating range greater than 1 mA at 1 kHz. This system is composed of

Automated Direct Comparison of Two Cryocooled 10 Volt Programmable Josephson Voltage Standards

July 6, 2018
Author(s)
Alain Rufenacht, Yi-hua D. Tang, Stephane Solve, Anna E. Fox, Paul D. Dresselhaus, Charles J. Burroughs, Robert E. Schwall, Regis Chayramy, Samuel P. Benz
We have performed direct dc comparisons between two cryocooled 10 V programmable Josephson voltage standards utilizing an automated synchronization scheme for the voltage reversals, which enables the use of a high-sensitivity analog null detector on its 10

The Boltzmann Project

February 5, 2018
Author(s)
Samuel P. Benz, Joachim Fischer, Bernd Fellmuth, Christof Gaiser, Laurent Pitre, Fernando Sparasci, Lara Risegari, Roberto M. Gavioso, D M. Rippa, Bengt Hallstedt, Jifeng Qu, XiaoJuan Feng, Jianqiang Zhang, David R. White, L Gianfrani, A Castrillo, L Moretti, B Darquie, C Daussy, S Briaudeau, O Kozlova, J J. Segovia, M C. Martin, D del Campo, Michael R. Moldover
The International Committee for Weights and Measures (CIPM), at its meeting in October 2017 followed the recommendation of the Consultative Committee for Units (CCU) on the redefinition of the kilogram, ampere, kelvin and mole. For the redefinition of the

Ultralow power artificial synapses using nanotextured magnetic Josephson junctions

January 28, 2018
Author(s)
Michael L. Schneider, Christine A. Donnelly, Stephen E. Russek, Burm Baek, Matthew R. Pufall, Peter F. Hopkins, Paul D. Dresselhaus, Samuel P. Benz, William H. Rippard
Neuromorphic computing is a promising avenue to dramatically improve the efficiency of certain computational tasks, such as perception and decision making. Neuromorphic systems are currently being developed for critical applications ranging from self

The NIST Johnson noise thermometry system for the determination of the Boltzmann constant

December 29, 2017
Author(s)
Nathan Flowers-Jacobs, Alessio Pollarolo, Kevin Coakley, Adam C. Weis, Anna Fox, Horst Rogalla, Weston L. Tew, Samuel Benz
In preparation for the redefinition of the International System of Units (SI), five different electronic measurements of the Boltzmann constant have been performed using different Johnson noise thermometry (JNT) systems over the past seven years. In this

A Boltzmann Constant Determination Based on Johnson Noise Thermometry

August 10, 2017
Author(s)
Nathan E. Flowers-Jacobs, Alessio Pollarolo, Kevin J. Coakley, Anna E. Fox, Horst Rogalla, Weston L. Tew, Samuel P. Benz
A value for the Boltzmann constant was measured electronically using an improved version of the Johnson Noise Thermometry (JNT) system at the National Institute of Standards and Technology (NIST), USA. This system is different from prior ones, including

An improved electronic measurement of the Boltzmann constant by Johnson noise thermometry

July 18, 2017
Author(s)
Jifeng Qu, Samuel Benz, Kevin Coakley, Horst Rogalla, Weston L. Tew, David R. White, Kunli Zhou, Zhenyu Zhou
Recent measurements using acoustic gas thermometry have determined the value of the Boltzmann constant, k, with a relative uncertainty less than 110-6. These results have been supported by a measurement with a relative uncertainty of 1.910-6 made with

Fabrication of High-Speed and High-Density Single-Flux-Quantum Circuits at NIST

June 11, 2017
Author(s)
David Olaya, Paul Dresselhaus, Pete Hopkins, Samuel P. Benz
The development of a fabrication process for single-flux-quantum (SFQ) digital circuits is a fundamental part of the NIST effort to develop a gigahertz waveform synthesizer with quantum voltage accuracy. This paper describes the current SFQ fabrication

Scalable, High-Speed, Digital Single-Flux-Quantum Circuits at NIST

June 11, 2017
Author(s)
Pete Hopkins, Manuel Castellanos Beltran, Christine A. Donnelly, Paul Dresselhaus, David Olaya, Adam Sirois, Samuel P. Benz
We describe NIST's capabilities for designing and fabricating niobium-based single-flux quantum (SFQ) digital and mixed-signal circuits and show test results of our first circuits. We have assembled a package of software design tools that are readily

Advanced Waveform Synthesis with Pulse-driven Josephson Voltage Standards

February 21, 2017
Author(s)
Justus A. Brevik, Nathan E. Flowers-Jacobs, Anna E. Fox, Evan B. Golden, Paul D. Dresselhaus, Samuel P. Benz
We describe the implementation of new commercial pulse-bias electronics that have enabled an improvement in the generation of quantum-accurate waveforms both with and without low-frequency compensation biases. We have used these electronics to apply a

On-Chip Temperature Distribution for Josephson Voltage Standards

November 22, 2016
Author(s)
Anna E. Fox, Evan B. Golden, Paul D. Dresselhaus, Samuel P. Benz
A substrate surface temperature characterization for the National Institute of Standards and technology Josephson voltage standard has been performed by fabricating and measuring Josephson junction arrays with on-chip thermometry. Circuits were designed