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Search Publications by: Jim Booth (Fed)

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Displaying 1 - 25 of 237

Glass microwave microfluidic devices for broadband characterization of diverse fluids

November 15, 2024
Author(s)
Jacob Pawlik, Tomasz Karpisz, Yasaman Kazemipour, Nicholas Derimow, Sarah Evans, Bryan Bosworth, Christian Long, Nathan Orloff, James Booth, Angela Stelson
We demonstrate a glass microwave microfluidic device for determining the permittivity of a wide range of liquid chemicals from 100 MHz to 10 GHz with relatively low uncertainty. Conventional microwave microfluidic devices use polymer-based microfluidic

Broadband Characterization of Flexible Conductor-Dielectric Composites

November 4, 2024
Author(s)
Luckshitha Suriyasena Liyanage, Nathan Orloff, Nicholas Jungwirth, Sarah Evans, Christian Long, Angela Stelson, Jacob Pawlik, James Booth
Broadband measurements are important for characterizing a wide range of materials for communications applications at microwave and mm-wave frequencies. Here we report on broadband measurements of the effective permittivity of conductor-dielectric flexible

Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a Glass Wafer Stack from 100 MHz to 30 GHz

July 30, 2024
Author(s)
Jacob Pawlik, Tomasz Karpisz, Nicholas Derimow, Sarah Evans, Jim Booth, Nate Orloff, Chris Long, Angela Stelson
We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave electronics on the rise, reliable methods for measuring the

On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors

July 30, 2024
Author(s)
Tomasz Karpisz, Jacob Pawlik, Johannes Hoffmann, Sarah Evans, Christian Long, Nathan Orloff, James Booth, Angela Stelson
On-wafer calibrations are critical for measurements of embedded devices at the correct reference planes. A major challenge in on-wafer calibrations is the development of accurate calibrations that cover a frequency range from MHz to THz. Another challenge

Energy Efficiency Scaling for 2 Decades (EES2) Roadmap for Computing

July 14, 2024
Author(s)
Jim Booth
Abstract—In response to the looming crisis in global energy consumption required for advanced computing applications, the United States Department of Energy (DOE) Advanced Materials and Manufacturing Technology Office (AMMTO) is leading a national effort

Quantifying the Effect of Guest Binding on Host Environment

August 29, 2023
Author(s)
Angela Stelson, Zack Fishman, Jacob Pawlik, Gosia Musial, Jim Booth, Chris Long, Kathleen Schwarz, Nate Orloff, Hugh Ryan, Angela Grommet, Jonathan Nitschke, Felix Rizzuto
The environment around a host-guest complex is defined by of intermolecular interactions between solvent molecules and counter ions. These interactions govern both the solubility of these complexes and the rates of reactions confined within them11. Such

Broadband Electromagnetic Properties of Engineered Flexible Absorber Materials

August 23, 2023
Author(s)
Luckshitha Suriyasena Liyanage, Connor Smith, Jacob Pawlik, Sarah Evans, Angela Stelson, Chris Long, Nate Orloff, David Arnold, Jim Booth
Flexible and stretchable materials have attracted significant interest for applications in wearable electronics and bioengineering fields. Recent developments also incorporate embedded microwave circuits, components, and systems with engineered flexible

Microwave Characterization of Parylene C Dielectric and Barrier Properties

June 29, 2023
Author(s)
Nikolas Dale Barrera, Jacob Pawlik, Eugene Yoon, James Booth, Christian Long, Nathan Orloff, Ellis Meng, Angela Stelson
Parylene C thin films are commonly used as a passivation layer, protective coating, or substrate material in implantable medical devices. However, fluid or vapor may permeate through Parylene C films over time through defects, film edges, or bulk diffusion

Broadband, High-Frequency Permittivity Characterization for Epitaxial Ba1-xSrxTiO3 Composition-Spread Thin Films

June 24, 2021
Author(s)
Eric J. Marksz, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Nate Orloff, Xiaohang Zhang, Naila Al Hasan, Justin Pearson, Ichiro Takeuchi
Next-generation millimeter-wave (> 30 GHz) telecommunications electronics must be compact, energy efficient, and have good thermal management. Tunable materials may play a role in meeting these requirements for millimeter-wave front-ends, but there are few

Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz

April 9, 2020
Author(s)
Aaron Hagerstrom, Eric J. Marksz, Xiaohang Zhang, Xifeng Lu, Chris Long, James Booth, Ichiro Takeuchi, Nate Orloff
Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric eld. In

Materials Characterization With Multiple Offset Reflects at Frequencies to 110 GHz

January 8, 2020
Author(s)
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, Jim Booth, Edward Garboczi, Chris Long, Nate Orloff
Understanding the electrical properties of materials is a necessary part of any microwave circuit design. In this article, we explore the possibility of employing multiple-offset-reflect devices for on-wafer materials characterization at frequencies up to

Targeted chemical pressure yields tuneable millimetre-wave dielectric

December 23, 2019
Author(s)
Natalie M. Dawley, Eric J. Marksz, Aaron Hagerstrom, Gerhard H. Olsen, Megan E. Holtz, Jingshu Zhang, Chris Long, Craig Fennie, David A. Muller, Darrell G. Schlom, James Booth, Nate Orloff
Tunable dielectrics are key constituents for emerging high-frequency devices in telecommunications—including tunable filters, phase shifters, and baluns—and for miniaturizing frequency-agile microwave and millimeter-wave components. Today, strained films

Optimal Series Resistors for On-Wafer Calibrations

November 8, 2019
Author(s)
Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long
The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar waveguide transmission lines. While much work has been done using series resistors, this paper