May 18, 2011
Author(s)
Mark C. Strus, Ann C. Chiaramonti Debay, Robert R. Keller, Yung J. Jung, Younglae Kim
We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find that