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Search Publications by: Marcus Mendenhall (Fed)

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Displaying 1 - 23 of 23

The NIST Silicon Lattice Comparator Upgrade

October 3, 2023
Author(s)
Marcus Mendenhall, James Cline, Csilla Szabo-Foster, Albert Henins
The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between specimens of high-quality float-zone silicon to delta-d/d approximately 6e-9. It has recently

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021
Author(s)
Marcus Mendenhall, David R. Black, Donald Windover, James Cline
The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according to equations based on dipole scattering, also known as kinematic X-ray scattering. Although this

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

July 31, 2020
Author(s)
James Cline, Marcus Mendenhall, Joseph J. Ritter, David R. Black, Albert Henins, John E. Bonevich, Pamela S. Whitfield, James J. Filliben
This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of crystallite size from a consideration of powder diffraction line profile broadening. It consists

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020
Author(s)
David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM

THE CERTIFICATION OF STANDARD REFERENCE MATERIAL 660C FOR POWDER DIFFRACTION

January 15, 2020
Author(s)
David R. Black, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to evaluate specific aspects of instrument performance of both x-ray and neutron powder diffractometers. This report describes SRM 660c, the

The Molybdenum K-shell X-ray Emission Spectrum

September 18, 2019
Author(s)
Marcus H. Mendenhall, Lawrence T. Hudson, Csilla I. Szabo-Foster, Albert Henins, James P. Cline
Abstract We present newly measured spectra of the X-ray emission of a molybdenum metal anode subject to electron bombardment, using a very high dispersion silicon double-crystal spectrometer. The measurement includes the dipole-allowed KL, KM, and KN

Contemporary x-ray wavelength metrology and traceability

July 3, 2019
Author(s)
Lawrence T. Hudson, James P. Cline, Albert Henins, Marcus H. Mendenhall, Csilla I. Szabo-Foster
We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary standard x-ray wavelengths are typically measured with two-crystal (or more) diffraction spectrometers operated in

Poisson errors and adaptive rebinning in X-ray Powder Diffraction Data

October 10, 2018
Author(s)
Marcus H. Mendenhall
Abstract This work provides a short summary of techniques for formally-correct handling of statistical uncertainties in Poisson- statistics dominated data. Correct assignment of uncertainties for low counts is documented. We describe a technique for

Certification of Standard Reference Material 1879b Respirable Cristobalite

July 27, 2018
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Craig Brown, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1879b, the third generation

High-precision measurement of the X-ray Cu K-alpha spectrum

May 12, 2017
Author(s)
Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline
The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 to 8100

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

May 11, 2017
Author(s)
Ernest G. Kessler Jr., Csilla Szabo-Foster, James Cline, Albert Henins, Lawrence T. Hudson, Marcus Mendenhall, Mark D. Vaudin
Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of x-ray wavelength and powder diffraction standards to the international system of units (SI). Here we both summarize and

Certification of Standard Reference Material 1878b Respirable Alpha Quartz

June 9, 2016
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1878b, the third generation

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration with NIST Standard Reference Materials

September 25, 2015
Author(s)
James P. Cline, Marcus H. Mendenhall, David R. Black, Donald A. Windover, Albert Henins
The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample

An algorithm for compensation of short-period errors in optical encoders

September 24, 2015
Author(s)
Marcus H. Mendenhall, Donald A. Windover, Albert Henins, James P. Cline
We present a simple way to collect data from an optical position or angle encoder with a readout which interpolates values between the optical features, and to process this data set so as to determine the short-range errors which arise from an

Certification of Standard Reference Material 1976b

September 15, 2015
Author(s)
David R. Black, Donald A. Windover, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation