November 18, 2021
Author(s)
Kyle McKay, Dustin Hite, Philip D. Kent, Shlomi S. Kotler, Dietrich Leibfried, Daniel Slichter, Andrew C. Wilson, David P. Pappas
We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with